MSM 98
MSM 98
Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems

Modeling Chapter 3

A Universal Low-Field Electron Mobility Model for Semiconductor Device Simulation
G. Kaiblinger-Grujin and S. Selberherr
Vienna Technical University, AT

PSDesigner: A Framework for Transistor Co-Optimization
R. Burch, S. Saxena, P.K. Mozumder, K. Vasanth, J. Davis and S. Rao
Texas Instruments, Inc., US

Residual Stresses/Strains Analysis of MEMS
T-R. Hsu and N. Sun
San Jose State University, US

A Global Finite Element Model for Improving the Thermo-Mechanical Reliability of IBGTs Modules
Y. Tronel and W. Fichtner
Swiss Federal Institute of Technology Zürich, CH

Modeling of Strain in Boron-Doped Silicon Cantilevers
H.A. Rueda and M.E. Law
University of Florida, US

Adaptive Hierarchical Finite Element Modeling of Dopant Diffusion
A. Bose and C.S. Rafferty
Bell Laboratories, US

3-D Electrothermal Model of Multifinger, High-Power HBTs
F. Dhondt, J. Barrette, P.A. Rolland and S. Delage
IEMN, FR

Fault Model Generation for MEMS
A. Kolpekwar, C Kellen and R.D. Blanton
Carnegie Mellon University, US

A Floating Random-Walk Method for Efficient RC Extraction of Complex IC-Interconnect Structures
R.B. Iverson and Y.L. LeCoz
Random Logic Corporation, US

Yield Prediction Under Non-Standard Data Distributions
S. Rao, S. Saxena, P. Apte, P.K. Mozumder, J. Davis, R. Burch and K. Vasanth
Texas Instruments, Inc., US

Drain and Gate Voltage Influences on MAGFET Offset and Sensitivity: Modeling and Experiment
A.M. Ionescu, N. Mathieu and A. Chovet
LPCS/ENSERG, FR

Reliability Issues in Microelectromechanical Systems
X.J.R. Avula
University of Missouri-Rolla, US


ISBN: 0-96661-35-0-3
Pages: 678