Modeling

	MSM 98 Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems Chapter 3: Modeling
-	A Universal Low-Field Electron Mobility Model for Semiconductor Device Simulation
	G. Kaiblinger-Grujin and S. Selberherr
	Vienna Technical University, Austria
-	PSDesigner: A Framework for Transistor Co-Optimization
	R. Burch, S. Saxena, P.K. Mozumder, K. Vasanth, J. Davis and S. Rao
	Texas Instruments, Inc., U.S.A.
-	Residual Stresses/Strains Analysis of MEMS
	T-R. Hsu and N. Sun
	San Jose State University, U.S.A.
-	A Global Finite Element Model for Improving the Thermo-Mechanical Reliability of IBGTs Modules
	Y. Tronel and W. Fichtner
	Swiss Federal Institute of Technology Zürich, Switzerland
-	Modeling of Strain in Boron-Doped Silicon Cantilevers
	H.A. Rueda and M.E. Law
	University of Florida, U.S.A.
-	Adaptive Hierarchical Finite Element Modeling of Dopant Diffusion
	A. Bose and C.S. Rafferty
	Bell Laboratories, U.S.A.
-	3-D Electrothermal Model of Multifinger, High-Power HBTs
	F. Dhondt, J. Barrette, P.A. Rolland and S. Delage
	IEMN, France
-	Fault Model Generation for MEMS
	A. Kolpekwar, C Kellen and R.D. Blanton
	Carnegie Mellon University, U.S.A.
-	A Floating Random-Walk Method for Efficient RC Extraction of Complex IC-Interconnect Structures
	R.B. Iverson and Y.L. LeCoz
	Random Logic Corporation, U.S.A.
-	Yield Prediction Under Non-Standard Data Distributions
	S. Rao, S. Saxena, P. Apte, P.K. Mozumder, J. Davis, R. Burch and K. Vasanth
	Texas Instruments, Inc., U.S.A.
-	Drain and Gate Voltage Influences on MAGFET Offset and Sensitivity: Modeling and Experiment
	A.M. Ionescu, N. Mathieu and A. Chovet
	LPCS/ENSERG, France
-	Reliability Issues in Microelectromechanical Systems
	X.J.R. Avula
	University of Missouri-Rolla, U.S.A.
ISBN:	0-96661-35-0-3
Pages:	678
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