 | MSM 98
Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems
Chapter 3: Modeling |
| - | A Universal Low-Field Electron Mobility Model for Semiconductor Device Simulation |
| | G. Kaiblinger-Grujin and S. Selberherr |
| | Vienna Technical University, Austria |
| - | PSDesigner: A Framework for Transistor Co-Optimization |
| | R. Burch, S. Saxena, P.K. Mozumder, K. Vasanth, J. Davis and S. Rao |
| | Texas Instruments, Inc., U.S.A. |
| - | Residual Stresses/Strains Analysis of MEMS |
| | T-R. Hsu and N. Sun |
| | San Jose State University, U.S.A. |
| - | A Global Finite Element Model for Improving the Thermo-Mechanical Reliability of IBGTs Modules |
| | Y. Tronel and W. Fichtner |
| | Swiss Federal Institute of Technology Zürich, Switzerland |
| - | Modeling of Strain in Boron-Doped Silicon Cantilevers |
| | H.A. Rueda and M.E. Law |
| | University of Florida, U.S.A. |
| - | Adaptive Hierarchical Finite Element Modeling of Dopant Diffusion |
| | A. Bose and C.S. Rafferty |
| | Bell Laboratories, U.S.A. |
| - | 3-D Electrothermal Model of Multifinger, High-Power HBTs |
| | F. Dhondt, J. Barrette, P.A. Rolland and S. Delage |
| | IEMN, France |
| - | Fault Model Generation for MEMS |
| | A. Kolpekwar, C Kellen and R.D. Blanton |
| | Carnegie Mellon University, U.S.A. |
| - | A Floating Random-Walk Method for Efficient RC Extraction of Complex IC-Interconnect Structures |
| | R.B. Iverson and Y.L. LeCoz |
| | Random Logic Corporation, U.S.A. |
| - | Yield Prediction Under Non-Standard Data Distributions |
| | S. Rao, S. Saxena, P. Apte, P.K. Mozumder, J. Davis, R. Burch and K. Vasanth |
| | Texas Instruments, Inc., U.S.A. |
| - | Drain and Gate Voltage Influences on MAGFET Offset and Sensitivity: Modeling and Experiment |
| | A.M. Ionescu, N. Mathieu and A. Chovet |
| | LPCS/ENSERG, France |
| - | Reliability Issues in Microelectromechanical Systems |
| | X.J.R. Avula |
| | University of Missouri-Rolla, U.S.A. |
| - | A Universal Low-Field Electron Mobility Model for Semiconductor Device Simulation |
| | G. Kaiblinger-Grujin and S. Selberherr |
| | Vienna Technical University, Austria |
| - | PSDesigner: A Framework for Transistor Co-Optimization |
| | R. Burch, S. Saxena, P.K. Mozumder, K. Vasanth, J. Davis and S. Rao |
| | Texas Instruments, Inc., U.S.A. |
| - | Residual Stresses/Strains Analysis of MEMS |
| | T-R. Hsu and N. Sun |
| | San Jose State University, U.S.A. |
| - | A Global Finite Element Model for Improving the Thermo-Mechanical Reliability of IBGTs Modules |
| | Y. Tronel and W. Fichtner |
| | Swiss Federal Institute of Technology Zürich, Switzerland |
| - | Modeling of Strain in Boron-Doped Silicon Cantilevers |
| | H.A. Rueda and M.E. Law |
| | University of Florida, U.S.A. |
| - | Adaptive Hierarchical Finite Element Modeling of Dopant Diffusion |
| | A. Bose and C.S. Rafferty |
| | Bell Laboratories, U.S.A. |
| - | 3-D Electrothermal Model of Multifinger, High-Power HBTs |
| | F. Dhondt, J. Barrette, P.A. Rolland and S. Delage |
| | IEMN, France |
| - | Fault Model Generation for MEMS |
| | A. Kolpekwar, C Kellen and R.D. Blanton |
| | Carnegie Mellon University, U.S.A. |
| - | A Floating Random-Walk Method for Efficient RC Extraction of Complex IC-Interconnect Structures |
| | R.B. Iverson and Y.L. LeCoz |
| | Random Logic Corporation, U.S.A. |
| - | Yield Prediction Under Non-Standard Data Distributions |
| | S. Rao, S. Saxena, P. Apte, P.K. Mozumder, J. Davis, R. Burch and K. Vasanth |
| | Texas Instruments, Inc., U.S.A. |
| - | Drain and Gate Voltage Influences on MAGFET Offset and Sensitivity: Modeling and Experiment |
| | A.M. Ionescu, N. Mathieu and A. Chovet |
| | LPCS/ENSERG, France |
| - | Reliability Issues in Microelectromechanical Systems |
| | X.J.R. Avula |
| | University of Missouri-Rolla, U.S.A. |
| ISBN: | 0-96661-35-0-3 |
| Pages: | 678 |
| Hardcopy: | $100.00 |
| Special: | 3 CD Set — 15% off with Free Shipping |
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