Nanotech 2002 Vol. 1
Nanotech 2002 Vol. 1
Technical Proceedings of the 2002 International Conference on Modeling and Simulation of Microsystems

Process Modeling Chapter 8

Characterization of Ion Implantation in Si Using Infrared Spectroscopy with a Lock-In common-Mode-Rejection Demodulation

Authors: F. Rábag, A. Mandelis and A. Salnik

Affilation: University of Toronto, Canada

Pages: 450 - 453

Keywords: semiconductors, ion implantation, photothermal radiometry

B+, P+, and As+ ion-implanted Si wafers in the implantation dose range 1x1011 - 1x1013 ions/cm2 were characterized using Photothermal Radiometry (PTR). A comparison between the conventional frequency scan and a new technique called Common-Mode-Rejection Demodulation (CMRD) was done. It was found that the CMRD technique can significantly enhance the resolution of PTR response curves from P+ ion implanted wafers in cases where conventional square wave frequency scans were totally or partially unable to resolve the dose. The dose resolution improvements afforded by the CMRD technique may be important toward better control of the ion implantation process in electronic devices, in a dose range which has traditionally been difficult to monitor optically owing to the effects induced by the early stages of the amorphization process in the implanted layer.

ISBN: 0-9708275-7-1
Pages: 764

2015 & Newer Proceedings

Nanotech Conference Proceedings are now published in the TechConnect Briefs

NSTI Online Community