Nano Science and Technology Institute
Nanotech 2002 Vol. 1
Nanotech 2002 Vol. 1
Technical Proceedings of the 2002 International Conference on Modeling and Simulation of Microsystems
 
Chapter 12: Circuit Simulation
 

Characterization of “Multipath Interconnects” for Microelectronic and Nanotechnology Circuits

Authors:A.K. Goel and N.R. Eady
Affilation:Michigan Technological University, US
Pages:632 - 635
Keywords:interconnects, capacitances, Green’s function, nanoelectronics, VLSI
Abstract:A multipath interconnect carries a signal by using the concept of parallel processing by providing two or more paths between the driver and the load. These paths are stacked vertically isolated from one another by insulating layers between them. In this paper, we have used the Green’s function method to determine the parasitic capacitances associated with a system of multipath interconnects printed on a silicon-based substrate.
Characterization of “Multipath Interconnects” for Microelectronic and Nanotechnology CircuitsView PDF of paper
ISBN:0-9708275-7-1
Pages:764
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