Authors: Y. Subramanian and R.B. Darling
Affilation: University of Washington, United States
Pages: 628 - 631
Keywords: tunneling, compact modeling, ESD, CAD
This paper presents compact, physically-based electrothermal models for direct as well as indirect bandgap tunneling processes in pn-junctions for use in network simulators (e.g. Saber or VHDL-A). The model for indirect tunneling has been validated using a 3.3V Si Zener diode (1N4728). Self-heating effects have also been included. The above tunneling breakdown models, together with the compact models for avalanche breakdown presented previously constitute a complete, compact representation of breakdown in ESD zener diodes. Their utility lies in the simulation of large systems of interconnected ESD structures, without detailed device analysis, permitting a 'CAD-for-ESD' approach in commercial ESD design.