Nanotech 2001 Vol. 1
Nanotech 2001 Vol. 1
Technical Proceedings of the 2001 International Conference on Modeling and Simulation of Microsystems

Optimization Chapter 5

A Method for Determining the Dependence of Integrated Circuit Performance on Silicon Process, Device and Circuit Parameters

Authors: L.B. Sipahi, B.A. Myers and T.J. Sanders

Affilation: Intersil Corporation, United States

Pages: 173 - 172

Keywords: modeling, simulation, statistical design, wireless communications, semiconductor IC manufacturing

Abstract:
The goal of this project is to develop a structured methodology for achieving a design of a block of circuit in an IC which is more compliant to the specification using a multiple simulation approach. This has been accomplished by developing a statistical design and simulation methodology. This methodology has been demonstrated by simulating a Bipolar Low Noise Amplifier (LNA) circuit using micro-level semiconductor device parameters and associated manufacturing process parameters for the circuit parameters of interest. The physics-based device and process models are then coupled with proprietary statistical simulation software (STADIUM") to create a robust circuit design which gives rise to a more compliant product with higher yields.

A Method for Determining the Dependence of Integrated Circuit Performance on Silicon Process, Device and Circuit Parameters

ISBN: 0-9708275-0-4
Pages: 638