Nano Science and Technology Institute
Nanotech 2001 Vol. 1
Nanotech 2001 Vol. 1
Technical Proceedings of the 2001 International Conference on Modeling and Simulation of Microsystems
 
Chapter 5: Optimization
 

A Method for Determining the Dependence of Integrated Circuit Performance on Silicon Process, Device and Circuit Parameters

Authors:L.B. Sipahi, B.A. Myers and T.J. Sanders
Affilation:Intersil Corporation, US
Pages:173 - 172
Keywords:modeling, simulation, statistical design, wireless communications, semiconductor IC manufacturing
Abstract:The goal of this project is to develop a structured methodology for achieving a design of a block of circuit in an IC which is more compliant to the specification using a multiple simulation approach. This has been accomplished by developing a statistical design and simulation methodology. This methodology has been demonstrated by simulating a Bipolar Low Noise Amplifier (LNA) circuit using micro-level semiconductor device parameters and associated manufacturing process parameters for the circuit parameters of interest. The physics-based device and process models are then coupled with proprietary statistical simulation software (STADIUM') to create a robust circuit design which gives rise to a more compliant product with higher yields.
A Method for Determining the Dependence of Integrated Circuit Performance on Silicon Process, Device and Circuit ParametersView PDF of paper
ISBN:0-9708275-0-4
Pages:638
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