Compact Modeling of Avalanche Breakdown in pn-Junctions for Computer-Aided ESD Design (CAD for ESD)

	Nanotech 2001 Vol. 1 Technical Proceedings of the 2001 International Conference on Modeling and Simulation of Microsystems Chapter 3: Compact Modeling and Model Order Reduction
	Compact Modeling of Avalanche Breakdown in pn-Junctions for Computer-Aided ESD Design (CAD for ESD)
Authors:	Y. Subramanian and R.B. Darling
Affilation:	University of Washington, US
Pages:	48 - 51
Keywords:	avalanche, breakdown, pn junction, ESD, CAD
Abstract:	This paper presents and validates compact, physically-based electrothermal models of the avalanche process in pn junctions for use in network simulators (e.g. Saber). Self-heating effects are also included. This enables the simulation of large systems of interconnected ESD structures, permitting a 'CAD-for-ESD' approach in commercial ESD design.
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ISBN:	0-9708275-0-4
Pages:	638
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