Nano Science and Technology Institute
Nanotech 2001 Vol. 1
Nanotech 2001 Vol. 1
Technical Proceedings of the 2001 International Conference on Modeling and Simulation of Microsystems
 
Chapter 3: Compact Modeling and Model Order Reduction
 

Compact Modeling of Avalanche Breakdown in pn-Junctions for Computer-Aided ESD Design (CAD for ESD)

Authors:Y. Subramanian and R.B. Darling
Affilation:University of Washington, US
Pages:48 - 51
Keywords:avalanche, breakdown, pn junction, ESD, CAD
Abstract:This paper presents and validates compact, physically-based electrothermal models of the avalanche process in pn junctions for use in network simulators (e.g. Saber). Self-heating effects are also included. This enables the simulation of large systems of interconnected ESD structures, permitting a 'CAD-for-ESD' approach in commercial ESD design.
Compact Modeling of Avalanche Breakdown in pn-Junctions for Computer-Aided ESD Design (CAD for ESD)View PDF of paper
ISBN:0-9708275-0-4
Pages:638
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