Authors: S. Jamasb, S.D. Collins and R.L. Smith
Affilation: Conexant Systems, United States
Pages: 514 - 517
Keywords: flicker (1/f) noise, drift, ISFET
A physical model for drift in pH-sensitive ISFET's is employed to extract the inherent low-frequency noise power spectral density associated with these devices. The noise spectrum extracted from measured drift data demonstrates ideal 1/f noise behavior down to 10Hz. At lower frequencies, however, the resolution and accuracy of the ISFET is dominated by the drift behavior of the device. The distinction between drift and low-frequency noise is discussed based on the physical bases underlying each phenomenon.