Nano Science and Technology Institute
Nanotech 2001 Vol. 1
Nanotech 2001 Vol. 1
Technical Proceedings of the 2001 International Conference on Modeling and Simulation of Microsystems
 
Chapter 10: Semiconductor Device Modeling and Novel Structures Simulation
 

A Physics-Based Impact Ionization Model Using Six Moments of the Boltzmann Transport Equation

Authors:T. Grasser, H. Kosina, M. Gritsch and S. Selberherr
Affilation:TU Wien, AT
Pages:474 - 477
Keywords:device simulation, impact ionization, moments method, Boltzmann's equation
Abstract:Due to the ever decreasing device geometries non-local effects gain more and more importance. It is particularly well known that impact ionization is not properly described by neither a local field nor a local energy model because it is mainly determined by the high-energy tail of the carrier distribution function. Information about the high-energy tail is lost when only the average carrier energy is taken into account. To overcome this limitation, we use the fourth moment of the distribution function to account for the population of the high-energy tail. We propose a new impact ionization model using this tail temperature and compare the results obtained with existing models and Monte-Carlo simulations which show improvements obtained by our new model.
A Physics-Based Impact Ionization Model Using Six Moments of the Boltzmann Transport EquationView PDF of paper
ISBN:0-9708275-0-4
Pages:638
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