 | MSM 2000
Technical Proceedings of the 2000 International Conference on Modeling and Simulation of Microsystems
Chapter 8: Semiconductor Device Modeling |
Modelling Multilayer Semiconductor Structures | |
| Authors: | K. Brecl and J. Furlan |
| Affilation: | University of Ljubljana, SI |
| Pages: | 376 - 379 |
| Keywords: | modeling, multilayer devices, extended Ebers-Moll model |
| Abstract: | The interest in multilayer thin-film semiconductor structures is becoming bigger day by day. For multilayer structures both, low-quality and good-quality materials are used. An extended Ebers-Moll model for simulating multiayer structures was developed. The standard Ebers-Moll model for a transistor structure was extended to be used for more junctions. In addition photogenerated current, recombination current in space-charge region and carrier multiplication are added to the model. This model is actually used for a four-layer structure but can be easily extended to be used for any multilayer semiconductor device. |
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| ISBN: | 0-9666135-7-0 |
| Pages: | 741 |
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