 | MSM 2000
Technical Proceedings of the 2000 International Conference on Modeling and Simulation of Microsystems
Chapter 8: Semiconductor Device Modeling |
Tunneling-Assisted Currents in n+p+ Amorphous Silicon Junctions | |
| Authors: | J. Furlan and Z. Gorup |
| Affilation: | University of Ljubljana, SI |
| Pages: | 352 - 355 |
| Keywords: | amorphous silicon, pn junction, tunneling currents |
| Abstract: | A theoretical model for the tunneling transport of charge carriers in forward-biased heavily doped amorphous silicon pn junctions was recently presented. In this paper, in addition to current-voltage characteristics in the forward direction, reverse-voltage characteristics are calculated and compared to the measured characteristics. The trap-assisted tunneling transport of carriers is described in terms of tunneling factor G, which can be treated as an effective increase in the apparent capture cross-section of carriers. Crucial factors affecting highly enhanced recombination-generation currents due to tunneling-assisted capture-emission and to potential barrier-lowering (Poole-Frenkel effect) at forward and reverse bias are discussed. |
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| ISBN: | 0-9666135-7-0 |
| Pages: | 741 |
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