Nano Science and Technology Institute
MSM 2000
MSM 2000
Technical Proceedings of the 2000 International Conference on Modeling and Simulation of Microsystems
Chapter 8: Semiconductor Device Modeling

Tunneling-Assisted Currents in n+p+ Amorphous Silicon Junctions

Authors:J. Furlan and Z. Gorup
Affilation:University of Ljubljana, SI
Pages:352 - 355
Keywords:amorphous silicon, pn junction, tunneling currents
Abstract:A theoretical model for the tunneling transport of charge carriers in forward-biased heavily doped amorphous silicon pn junctions was recently presented. In this paper, in addition to current-voltage characteristics in the forward direction, reverse-voltage characteristics are calculated and compared to the measured characteristics. The trap-assisted tunneling transport of carriers is described in terms of tunneling factor G, which can be treated as an effective increase in the apparent capture cross-section of carriers. Crucial factors affecting highly enhanced recombination-generation currents due to tunneling-assisted capture-emission and to potential barrier-lowering (Poole-Frenkel effect) at forward and reverse bias are discussed.
Tunneling-Assisted Currents in n+p+ Amorphous Silicon JunctionsView PDF of paper
© 2017 Nano Science and Technology Institute. All Rights Reserved.
Terms of Use | Privacy Policy | Contact Us | Site Map