Nano Science and Technology Institute
MSM 2000
MSM 2000
Technical Proceedings of the 2000 International Conference on Modeling and Simulation of Microsystems
Chapter 6: Characterization, Parameter Extraction, Calibration

Automatic Differentiation Technique in Device Model Parameter Extraction

Authors:B. Cheng, Z. Shao, L. Wang, T. Tang and Z. Yu
Affilation:Xi'an Jiaotong University,, CN
Pages:289 - 292
Keywords:automatic differentiation, parameter extraction, object oriented programming, MOSFET model
Abstract:Automatic Differentiation (AD), based on the nonstandard analysis theory, is a new technique in computer numerical analysis. An AD based algorithm for device model parameter extraction is presented. Using this algorithm, the constrained parameter extraction for a surface potential based MOSFET drain current model was done, and the average relative error between calculated and measured current is less than 2%.
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