Nano Science and Technology Institute
Technical Proceedings of the 2000 International Conference on Modeling and Simulation of Microsystems
MSM 2000
Technical Proceedings of the 2000 International Conference on Modeling and Simulation of Microsystems

Chapter 6:

Characterization, Parameter Extraction, Calibration

-Auto-Regressive Time Series Modeling of Stochastic Surfaces
 B.N.P. Rao and V.S.R. Murti
 Osmania University, India
-Atomic Force Microscopic Visualization of Identical Site on Cell Surface with Different Probes
 Y. Ohta, T. Kobayashi, H. Okamoto and T. Okuda
 Toyo University, Japan
-Modelling of Processes of Photoacoustic Diagnostic with Piezoelectric Detection
 O. Vertsanova, I. Perlov and B. Tsyganok
 National Technical University of Ukraine, Ukraine
-Finite-Element Modeling of 3C-SiC Membranes
 R.G. DeAnna, J. Mitchell, C.A. Zorman and M. Mehregany
 U.S. Army Research Laboratory, U.S.A.
-Vision-based Extraction of Geometry and Forces from Fabricated Micro Devices
 X. Wang, G.K. Ananthasuresh and J.P. Ostrowski
 University of Pennsylvania, U.S.A.
-Modeling of Acoustic-Structural Coupling in a MEMS Hydrophone
 H.T. Johnson and L. Prevot
 Boston University, U.S.A.
-Design, Simulation and Fabrication of a Bridge Structure Microtransducer
 M. Zanga, S.M. Zurn, D.L. Polla, B.J. Nelson and W.P. Robbins
 University of Minnesota, U.S.A.
-Topics in Finite-Element Modeling of Piezoelectric MEMS Devices
 F.J. von Preissig and E.S. Kim
 University of Hawaii at Manoa, U.S.A.
-Torsional Ratcheting Actuating System
 S.M. Barnes, S.L. Miller, M.S. Rodgers and F. Bitsie
 Sandia National Laboratories, U.S.A.
-Calculation of the AC Electroquasistatic Sinusoidal Steady-State Coulomb Force on a Conductor Coated with a Lossy Dielectric
 P. Osterberg and A. Inan
 University of Portland, U.S.A.
-Analysis of an Electrostatic Microactuator with the Help of Matlab/Simulink: Transient and Frequency Characteristics
 O. Français
 ELMI, France
-Resonant-Type Micro-Probe for Vertical Profiler
 E. Lebrasseaur, T. Bourouina, J-B. Pourcie, M. Ozaki, T. Masuzawa and H. Fujita
 LIMMS/CNRS-IIS, Japan
-Automatic Differentiation Technique in Device Model Parameter Extraction
 B. Cheng, Z. Shao, L. Wang, T. Tang and Z. Yu
 Xi'an Jiaotong University, China
-Triboelectromagnetic Phenomena at a Simulated Material Combination of a Head/Magnetic-Recording-Disk
 K. Nakayama
 Mechanical Engineering Laboratory, Japan
-3D Thermo-Electro-Mechanical Simulations of Gas Sensors Based on SOI Membranes
 C-C. Lu, D. Setiadi, F. Udrea, W.I. Milne, J.A. Covington and J.W. Gardner
 Cambridge University, United Kingdom
-Simulating IMD in SiGe HBTs: How good are our models?
 P. Wong and B. Pejcinovic
 Portland State University, U.S.A.
ISBN:0-9666135-7-0
Pages:741
Special:3 CD Set — 15% off with Free Shipping
Up
© Nano Science and Technology Institute. All Rights Reserved.
Terms of Use | Privacy Policy | Contact Us | Site Map