Nano Science and Technology Institute
MSM 2000
MSM 2000
Technical Proceedings of the 2000 International Conference on Modeling and Simulation of Microsystems

Chapter 11:

Numerics, Algorithms

-The Atomic Limit of Finite Elements in the Simulation of Micro-Resonators
 R.E. Rudd
 University of Oxford, UK
-3D Simulations of Ultra-Small MOSFETs: The Role of the Short Range Coulomb Interactions and Discrete Impurities on Device Terminal Characteristics
 W.J. Gross, D. Vasileska and D.K. Ferry
 Intel Corporation, US
-Robust Algorithms for Boundary-Element Integrals on Curved Surfaces
 X. Wang, J.N. Newman and J.K. White
 Massachusetts Institute of Technology, US
-A Quadratic Method for Nonlinear Model Order Reduction
 Y. Chen and J.K. White
 Massachusetts Institute of Technology, US
-A Novel Approach for Determining Pull-In Voltages in Micro-electro-mechanical Systems (MEMS)
 D.S. Long, M.A. Shannon and N.R. Aluru
 University of Illinois at Urbana-Champaign, US
-Nonlinear Analysis of Electrostatic Actuation in MEMS with Arbitrary Geometry
 S. Taschini, H. Baltes and J.G. Korvink
 ETH-Hoenggerberg, CH
-Mathematical Analysis of Electrostatically Actuated MEMS Devices
 D. Bernstein, P. Guidotti and J.A. Pelesko
 California Institute of Technology, US
-Reduced-Order Models of Stress-Stiffened MEMS Structures
 M. Varghese, V.L. Rabinovich and S.D. Senturia
 Massachusetts Institute of Technology, US
-Co-simulation and Optimization Micro Electro Mechanical Systems by Using Method of Theoretical Investigation
 V. Mkrttchian
 State Engineering University of Armenia, AM
-Finite Element Based Electrostatic-Structural Coupled Analysis with Automated Mesh Morphing
 V.I. Zhulin, S.J. Owen and D.F. Ostergaard
 ANSYS, Inc., US
-A Novel Approach to Simulate the Potential at the Center Axis of Poisson's Equation in Cylindrical Coordinates for Plasma Immersion Ion Implantation Processes
 D.T.K. Kwok, Z.M. Zeng and P.K. Chu
 City University of Hong Kong, CN
-Nonlocal Problems in MEMS Device Control
 J.A. Pelesko and A.A. Triolo
 Georgia Institute of Technology, US
-Closed-Loop, Neural Network Controlled Accelerometer Design
 E.I. Gaura, N. Ferreira, R.J. Rider and N. Steele
 Coventry University, UK
-A Mathematical Model for Process Control in Laser Chemical Vapor Deposition
 R. Nassar, W. Dai, C. Zhang, H. Lan and J. Maxwell
 Louisiana Tech University, US
-Discrete Impurity Effects in Silicon Quantom Dots
 S.N. Milicic, D. Vasileska, R. Akis, A. Gunther and S.M. Goodnick
 Arizona State University, US
ISBN:0-9666135-7-0
Pages:741
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