Nanotech 2002 Vol. 2
Nanotech 2002 Vol. 2
Technical Proceedings of the 2002 International Conference on Computational Nanoscience and Nanotechnology

Nanoscale Modeling of Front-End Processing in Silicon Chapter 10

Spatially Resolved Electron Energy-Loss Spectroscopy, a Tool to Verify Electronic Structure Calculations in Nanostructured Materials
G. Duscher, J. Plitzko, C. Kisielowski, R. Buzko, S.J. Pennycook and S.T. Pantelides
North Carolina State University, US

Nanoworld Semiconductor Industry - State and Future Challenges of Technology Computer Aided Design
H. Puchner
Cypress Semiconductor, US

Introducing Monte Carlo Diffusion Simulation into TCAD tools
N. Strecker, V. Moroz and M. Jaraiz
Avant!, US

Diffusion Mechanisms and Capture Radii in Silicon
K. Beardmore, W. Windl, B.P. Haley and N. Gronbech-Jensen
Motorola, US

Structural and Electronic Properties of Quantum Dot Surfaces
G. Galli, A Puzder, A.J. Willilamson, J.C. Grossman and L. Pizzagalli
Lawrence Livermore National Laboratory, US


ISBN: 0-9708275-6-3
Pages: 504