US and UK Companies Come Together to Create and Market Advanced Nanoparticle Analysis System
The FEI Company (US) and Malvern Instruments (UK) have formed a joint agreement to develop and promote advanced nanoparticle analysis utilizing Malvern’s particle image analysis software on FEI’s line of Quanta™ scanning electron microscopes (SEMs). The companies are planning for the bundled solution to be released by the end of this year, and will be offered to both current and potential customers of FEI and Malvern Instruments.
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