New Atomic Force Microscope (ATM) Could Bring Big Changes to Nano Imaging
Researchers at Georgia Tech announced this month that they have created FIRAT, an extremely sensitive atomic force microscopy (AFM) technology that is capable of high-speed imaging 100 times faster than current AFM technology. FIRAT (Force sensing Integrated Readout and Active Tip) is much faster than AFM and can capture additional measurements not possible before with AFM, including parallel molecular assays for drug screening and discovery, as well as material property imaging. This research breakthrough could prove invaluable for many types of nano-research, including translating into movies molecular interactions in real time. The National Science Foundation and the National Institutes of Health served as funders of this research.