| |
Nanoscale Characterization Committee
Committee Chairs
Annual Symposium Synopsys
Characterization is a cornerstone to nanoscale advancements, both in physical
and life sciences. Consequently, NSTI is proud to announce the creation of a
Special Conference and Community targeting the vast range of nanoscale
characterization techniques including microscopy, scattering,
spectroscopy/spectrometry and other tools, along with specimen preparation
methods and handling. NSTI will use this event and community to promote the
rapid education, dissemination, and commercialization of new characterization
techniques into industries based in both physical and life sciences. This
symposium seeks to elucidate methods that go well beyond novice understanding,
yet are broadly accessible and useful to industrial engineers and technicians.
Critical to the rational design of nanotechnologies, advances in
characterization include not only far-field probes such as beams of electrons,
ions, neutrons or photons; and near-field proximal probes such as indentors,
nanotips, fibers and nanotubes; but also a growing intellectual component
whereby data are manipulated, analyzed, rendered and simulated to yield
meaningful information. It is essential that this burgeoning knowledge base be
collated and transparently presented to the broad nanotechnology community. An
array of analytical techniques are more or less sensitive to surface versus
bulk, morphology versus chemistry, high- versus low-energy states, fast versus
slow dynamics, equilibrium versus perturbed response, elastic versus dissipative
interactions, etc.; often a combination of methods is required to achieve the
best goal, and we seek insight into these dichotomies to strengthen the base
understanding of each technique such that interpretations are not problematic
and insight is maximized.
Topics & Application Areas
- Direct space imaging methods
TEM, SEM, AFM, near-field optical, X-ray microscopy, topography and tomography, spatially resolved ion mass spectrometry, depth profiling with ions...
- Indirect space methods
X-ray, neutron and light scattering...
- Spectroscopy
NMR, FTIR, Raman, acoustic, dielectric spectroscopy...
|
- Mechanical properties
Nanometrology, nanotribology, nanoindentation...
- Rheology, solutions and processing
- Microfluidics
Coupled techniques with Lab-on-a-Chip
- Sample preparation and control
Thermalization, positioning, connecting...
|
Submit Proposal or Comment to Committee Chair
We encourage you to participate and to submit your interest as either an Scientific Committee Member or to organize a Scientific Committee*. The NSTI will provide the infrastructure for each Industrial Committee to organize and present a focused Symposium at the annual Nanotech Conference and Trade Show (Nanotech 2008, Boston, Massachusetts, June 1-5, 2008). Details will be provide upon approval of proposal.
* All submissions will be reviewed by the NSTI Scientific Committee
Chairs and a timely response will be issued.
Back to NSTI Scientific Leadership Committees
|
