Index of Keywords

surface potential

Comparison of Surface Potential and Charge-based MOSFET Core Models

Introduction to PSP MOSFET Model

RF-MOSFET Model Parameter Extraction with HiSIM

The Surface-Potential-Based model HiSIM-SOI and its Application to 1/f Noise in Fully-Depleted SOI-MOSFETs

HiSIM-1.2: The Effective Gate Length Validation with the Capacitance Data

Recent Enhancements of MOS Model 11

Noise Modeling with HiSIM Based on Self-Consistent Surface-Potential Description

HiSIM: Accurate Charge Modeling Important for RF Era

Field Enhancement and Work Function Difference of IrO2 Nano-Emitter Arrays using EFM and SKPM Spectroscopy

Theory and Modeling Techniques used in PSP Model

Advanced Compact MOSFET Model HiSIM2 Based on Surface Potentials with a Minimum Number of Approximation

Unified Approach to Bulk/SOI/UTB/s-DG MOSFET Compact Modeling

HiSIM2.4.0: Advanced MOSFET model for the 45nm Technology Node and Beyond

Surface Potential versus Voltage Equation from Accumulation to Strong Region for Undoped Symmetric Double-Gate MOSFETs and Its Continuous Solution

Analytical Solution of Surface Potential for Un-Doped Surrounding-Gate MOSFET

Complete Surface-Potential Modeling Approach Implemented in the HiSIM Compact Model Family for Any MOSFET Type

A Surface-Potential-Based Compact Model of AlGaN/GaN HEMTs Power Transistors

surface potential based

HiSIM-HV: a complete surface-potential-based MOSFET model for High Voltage Applications

High-Voltage MOSFET Model Valid for Device Optimization

surface potential based model

Benchmark Tests on Conventional Surface Potential Based Charge-Sheet Models And the Advanced PUNSIM Development