Index of Keywords


Hot-Carrier-Induced Current Degradation in Deep Sub-Micron MOSFETs from Subthreshold to Strong Inversion Region

Stable Magnetic Isotopes and Reliability of Biomolecular Nanoreactors

Reliability Prediction of Single-Crystal Silicon MEMS Using Dynamic Raman Spectroscopy

Impact of Channel Length and Gate Width of a N-MOSFET Device on the Threshold Voltage and its Fluctuations in Presence of Random Channel Dopants and Random Interface Trap: A 3D Ensemble Monte Carlo Stud

Nanolayer Interconnect Structures Ageing by Beam Resonance Method

A novel simulation methodology for full chip-package thermo-mechanical reliability investigations

Reliability Evaluation of Inkjet-Printed Silver Patterns for Application to Printed Circuit Board

reliability assessment

Virtual Component Qualification

Rapid Reliability Assessment Using CADMP-II

reliability evaluation

Investigation on Accelerated Ageing Techniques for IC Interconnect Structures in Context of Multicriterial Optimization of 3D SiP Design Flow

reliability issue

FinFET reliability issue analysis by forward gated-diode method

reliability test

Automated test system for in-situ testing of reliability and aging behaviour of thermal interface materials


NanoDAC/fibDAC - Nanodeformation Measurement Techniques for Reliability Analysis of MEMS and NEMS

reliable nanocomputing

An Architecture for Designing Noise-Tolerant QCA Nanocircuits

reliaiblity modeling

Modeling of Dynamic Threshold Voltage of High K Gate Stack and Application in FinFET Reliability


Photo-induced Surface Modification of Polyimides for Printable Electronics Fablication

remanence enhancement

The Microstructure and Computed Magnetic Properties of Nanoscaled Permanent Magnets


Nanotechnology and the Water Market: Applications and Health Effects

Green Remediation using Renewable Energy and Automation


Wafer Fabrication Process Simulation Including Cost: Which Should be Used in an In-Line Wafer Inspection Strategy, High Sensitivity and High Cost Inspection Machine or Low Sensitivity and Low Cost Inspection Machine?