Index of Keywords


MEMS Reliability Assessment ProgramMicro-electromechanical Systems (MEMS) Reliability Assessment Program for Department of Defense Activities

Floating Gate Devices: Operation and Compact Modeling

Experimental mechanical stress characterization of MEMS by using of confocal laser scanning microscope with a Raman spectroscopy interface

MEMS Reliability Assessment Program – Progress to Date

Analytical Methods for Nanotechnology

Analysis of an Ink Ejection Failure on a MEMS Micro-Injector Printing Head

MEMS Reliability Assessment Program – Progress to Date

Predicting the Positive Effects of Combined Metallurgical and Thermo-Mechanical Impacts on the Reliability of Solder Joint Interconnections

Gold Nanorods: Synthesis and Modulation of Optical Properties

Assessment of the Impacts of Packaging, Long-Term Storage, and Transportation on the Military MEMS

Simulation of Constant-Charge Biasing Integrated Circuit for High Reliability Capacitive RF MEMS Switch

Nanocomposite Contact Material for MEMS Switches

A Physical Based Hot Carrier Injection Compact Model for Nanoscale FinFET

Application of nanoindentation for constituent phases testing

In-situ MEMS Testing

Advanced In- and Out-off plane High Resolution X-ray Strain Analysis on MEMS

Numerical study on effect of random dopant fluctuation on double gate MOSFET based 6-T SRAM performance

Comparative Analysis of Threshold Voltage Variations in Presence of Random Channel Dopants and a Single Random Interface Trap for 45 nm N-MOSFET as Predicted by Ensemble Monte Carlo Simulation and Existing Analytical Model Expressions

Reliability Analysis of Low Temperature Low Pressure Ag-Sinter Die Attach

Correlation of Microstructure and Tribological Properties of Dry Sliding Nanocrystalline Diamond Coatings