Index of Keywords

morphology

ROS Evaluation for Series of CNTs Using the ESR Method and the Effects of CNT Mophology

morphology control

Flexible Morphology Control of Nanotube Arrays from Glancing Angle Deposition

Control of the morphology of nanoparticles resulting from the dynamic optimization of a fed-batch emulsion copolymerization process

MOS

Substrate Current Simulations at Elevated Temperatures

Mismatch Improvement with XMOS Structure

A Nano-Transistor with a Cavity

Influence of Si Nanocrystal Distribution on Electrical Characteristics of MOS Structures

Modeling Snapback and Rise-time Effects in TLP Testing for ESD MOS Devices using BSIM3 and VBIC Models

Ab initio calculation of tunneling current through ultra-thin SiO2 gate dielectric of MOS Structure, including the influence of oxygen vacancies on the tunneling current

Investigation of Metal Nano Layer Formation by the Tunneling Current through the Thin Oxide Film in the Electrolyte–Oxide–Silicon System

Metal-Oxide-Semiconductor Structures with Two and Three-Region Gate Dielectric Containing Silicon Nanocrystals: Structural, Infrared and Electrical Properties

MOS capacitance characteristics

A Threshold Voltage Modeling for a Spacer Trapping Memory Cell Using Verilog-A

MOS capacitor

A model to describe the hump-like feature observed in the accumulation branch of CV-characteristics of MOS capacitors with oxide-hosted Si nanoparticles

MOS capacitors

Modeling and Analysis of MOS Capacitor Controlled by Independent Double Gates

MOS compact modeling

Analytic Solution for the Drain Current of Undoped Symmetric Dual-Gate MOSFET

MOS current degradation

Mobility Degradation and Current Loss Due to Vertical Electric Field in Channel Area of Submicron MOS Devices

MOS current drive

Mobility Degradation and Current Loss Due to Vertical Electric Field in Channel Area of Submicron MOS Devices

MOS devices

Improved Modified Local Density Approximation for Modeling of Size Quantization in NMOSFETs

Compatible Hole Channel Mobility and Hole Quantum Correction Models for the TCAD optimization of Nanometer Scale PMOSFETs

Modeling of Size Quantization in Strained Si-nMOSFETs with the Improved Modified Local Density Approximation