Index of Keywords

few layers graphene

Mechanical properties of suspended few layers graphene sheets

FFD

The Physics of Pressure Powered Micro-Flow Focusing Device for the Encapsulation of Live Cells

FIB

Fabrication of 20 nm Embedded Longitudinal Nanochannels Transferred from Metal Nanowire Patterns

SOI Processing of a Ring Electrokinetic Chaotic Micromixer

Optimization of Nano-Machining with Focused IonBeams

Aspect Ratio Improvement using the 2-step NERIME FIB Top Surface Imaging Process for Nano-lithography Applications

An Introduction to Helium Ion Microscopy and its Nanotechnology Applications

High resolution Nanolithography using Focused Ion Beam Scanning Electron Microscopy (FIB SEM)

New Characterisation Techniques for the Study of Nanoscale Polymeric Systems in Two- & Three-Dimensions

Effective Use of Focused Ion Beam (FIB) in Investigating Fundamental Mechanical Properties of Metals at the Nano-Scale.

Fabrication and optical properties of nanoscale arrays of Au and Pd in polymers

Nanoscale Resolution Deformation Measurements at Crack Tips of Nanostructured Materials and Interface Cracks

A 20 µm Movable Micro Mobile

Focused Ion Beam machining of large and complex nanopatterns

Silicon Nanostructure Fabrication by Direct FIB Writing and TMAH Wet Chemical Etching

Application of focused ion beam technology for photonic nanostructures

Milling Process Control with Dimensional Feedback on a Focused Ion Beam - Scanning Electron Microscope System (FIB-SEM)

FIB etching and filling

Nanovias FIB-etching and filling in a micro-nano interposer for molecular electronics

FIB-SEM

Milling Process Control with Dimensional Feedback on a Focused Ion Beam - Scanning Electron Microscope System (FIB-SEM)

FIB/SEM

Milling Process Control with Dimensional Feedback on a Focused Ion Beam - Scanning Electron Microscope System (FIB-SEM)