Index of Keywords

deep-submicron MOSFET devices

A Velocity-Overshoot Subthreshold Current Model for Deep-Submicrometer MOSFET Devices

deep-submicron MOSFETs

Xsim: A Compact Model for Bridging Technology Developers and Circuit Designers

A Technology-based Compact Model for Predictive Deep-Submicron MOSFET Modeling and Characterization

A Technology-based Compact Model for Predictive Deep-Submicron MOSFET Modeling and Characterization

defect

Effects of Stone-Wales Defect on Adsorption & Insertion Capacity of Nanotubes

Defect reduction of Multiwalled Carbon Nanotubes by Rapid Vacuum Arc Annealing

Field Emission Properties of Carbon Nanotube Arrays with Defects and Impurities

defect analysis

Femtosecond laser micromachining of IC for semiconductor defect analysis

Advanced In- and Out-off plane High Resolution X-ray Strain Analysis on MEMS

defect characterization

Defects and Fault Characterization in Quantum Cellular Automata

defect classification

Inductive Fault Analysis of a Microresonator

defect control

NILCom® – Commercialization of Nanoimprint Lithography

defect modeling

A Defect Model for Metallic Carbon Nanotubes in Cell-based Logic Circuits

defect recombination

Modeling and Simulation of Non-Linear Damage Growth During Ion Implants in Silicon

defect structure

New ripening mechanism for silver and gold nanorods in aqueous solution

defect tolerance

Enhancement of Defect Tolerance in the QCA-based Programmable Logic Array (PLA)

defect-tolerance

Fault Detection and Diagnosis Techniques for Molecular Computing

Defects

Modeling Image Formation in Layered Structures: Application to X-ray Lithography

defects

Electronic Structure Modifications Induced by Nanosize Lattice Imperfections in Molecular Crystals

Chemical Decomposition of Solid Cyclotrimethylene Trinitramine