Index of Keywords

atomic force microscope

AFM Anodization Studied by Spectromicroscopy

Scanning Probe Lithography on InAs Substrate

Mechanical Nonlinear Generation with Coupled Torsional Harmonic Cantilevers for Sensitive and Quantitative Atomic Force Microscopy Imaging of Material Characteristics

Virtual Probe Microscope

Low Voltage Electron Beam Lithography in PMMA

New reference standards and artifacts for nanoscale property characterization

A New High Precision Procedure for AFM Probe Spring Constant Measurement using a Microfabricated Calibrated Reference Cantilever Array (CRCA)

Analysis of density variation for different temperatures in thermal nano imprinting process

Measurement of DPN-Ink Viscosity using an AFM Cantilever

Nanoscale Graphene Lithography Using an Atomic Force Microscope

atomic force microscope (AFM)

Investigation of Mechanical Strength of the Nanoshell of Bacteriophage Phi-29

atomic force microscopy

Atomic Force Microscopic Visualization of Identical Site on Cell Surface with Different Probes

Density Functional Calculations as a Tool for the Characterization of Ultra Thin Organic Films: Synthesis and spectroscopic characterization of RDX monolayers on glass substrates

Modeling AFM Induced Mechanical Deformation of Living Cells

Single-molecule Fluorescence and Force Microscopy Employing Carbon Nanotubes

Visualizing Individual Rhodopsin (a G Protein-Coupled Receptor) Molecules in Native Disk and Reconstituted Membranes via Atomic Force Microscopy

An Ultra-Fast Scheme for Sample-Detection in Dynamic-Mode Atomic Force Microscopy

A Carbon Nanotube-Based Sensor for Measuring Forces Developed by Cells

Enhancement of E6 Protein Binding on Binding-Orientation-Sensitive Mixed SAMs Molecules

Integrated Optical Profiler and AFM: a 3D Metrology System for Nanotechnology