Subscribe
|
Search
|
Contact
|
Site Map
|
About
Mission & Charter
NSTI Team
NSTI Fellows
Knowledge Network
Strategic Relationships
Nanotech Conference
Nanotech Database
Publications
Online Presence
Courses
Nanotechnology Short Courses
Instructors
Corporate Programs
Events
Event Announcements
Nanotech 2013
Microtech 2013
Biotech 2013
Cleantech 2013
TechConnect World 2013
Past Events
Publications
Nanotech Conference Technical Proceedings
Nanotech 2012 Vol. 1
Nanotech 2012 Vol. 2
Nanotech 2012 Vol. 3
Nanotech 2011 Vol. 1
Nanotech 2011 Vol. 2
Nanotech 2011 Vol. 3
Nanotech 2010 Vol. 1
Nanotech 2010 Vol. 2
Nanotech 2010 Vol. 3
Older NSTI Publications
Index of Authors
Index of Keywords
Index of Affiliations
Library Request Form
Shopping Cart
Order Form
Outreach
Subscribe
Unsubscribe
Courses
Nanotech Company Directory
Organizations
News
Nano World News
Subscribe
RSS Feed
Jobs
Annual Meeting
May 12-16, Washington, DC
Nanotech Proceedings
Nanotech 2012 Conference Proceedings
Now Available!
The most comprehensive up–to–date
body of work for 2012
NSTI Online Community
Free subscription!
Index of Authors
[
A
|
B
|
C
|
D
|
E
|
F
|
G
|
H
|
I
|
J
|
K
|
L
|
M
|
N
|
O
|
P
|
Q
|
R
|
S
|
T
|
U
|
V
|
W
|
X
|
Y
|
Z
]
[
<-
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
->
]
Author
Paper title
Zhou, X.
Compact Modeling of Doped Symmetric DG MOSFETs wit...
 
Differential Cytotoxicity of Metal Oxide Nanoparti...
 
Unified Compact Model for Generic Double-Gate MOSF...
 
Gummel Symmetry with Higher-order Derivatives in M...
 
New Properties and New Challenges in MOS Compact M...
 
Unified Regional Surface Potential for Modeling Co...
 
Quasi-2D Surface-Potential Solution to Three-Termi...
 
Unified Regional Surface Potential for Modeling Co...
 
A Technique for Constructing RTS Noise Model Based...
 
Generic Compact Model Development of Double-Gate M...
 
An Analytic Model of the Silicon-Based Nanowire Sc...
 
Interface Traps in Surface-Potential-Based MOSFET ...
 
A Unified Compact model for FinFET and Silicon Nan...
 
Compact Model Application to Statistical/Probabili...
 
1/f Noise Model for Double-Gate FinFET Biased in W...
 
A Simple, Accurate Capacitance-Voltage Model of Un...
 
A Unified Charge-Based Model for SOI MOSFETs Valid...
 
Non-Charge-Sheet Analytic Model for Ideal Retrogra...
 
Analytic Channel Potential Solution of Symmetric D...
 
Xsim: Benchmark Tests for the Unified DG/GAA MOSFE...
© 2013 Nano Science and Technology Institute. All Rights Reserved.
Terms of Use
|
Privacy Policy
|
Contact Us
|
Site Map