Subscribe
|
Search
|
Contact
|
Site Map
|
About
Mission & Charter
NSTI Team
NSTI Fellows
Knowledge Network
Strategic Relationships
Nanotech Conference
Nanotech Database
Publications
Online Presence
Courses
Nanotechnology Short Courses
Instructors
Corporate Programs
Events
Event Announcements
Nanotech 2013
Microtech 2013
Biotech 2013
Cleantech 2013
TechConnect World 2013
Past Events
Publications
Nanotech Conference Technical Proceedings
Nanotech 2012 Vol. 1
Nanotech 2012 Vol. 2
Nanotech 2012 Vol. 3
Nanotech 2011 Vol. 1
Nanotech 2011 Vol. 2
Nanotech 2011 Vol. 3
Nanotech 2010 Vol. 1
Nanotech 2010 Vol. 2
Nanotech 2010 Vol. 3
Older NSTI Publications
Index of Authors
Index of Keywords
Index of Affiliations
Library Request Form
Shopping Cart
Order Form
Outreach
Subscribe
Unsubscribe
Courses
Nanotech Company Directory
Organizations
News
Nano World News
Subscribe
RSS Feed
Jobs
Annual Meeting
May 12-16, Washington, DC
Nanotech Proceedings
Nanotech 2012 Conference Proceedings
Now Available!
The most comprehensive up–to–date
body of work for 2012
NSTI Online Community
Free subscription!
Index of Affiliations
[
3
|
A
|
B
|
C
|
D
|
E
|
F
|
G
|
H
|
I
|
J
|
K
|
L
|
M
|
N
|
O
|
P
|
Q
|
R
|
S
|
T
|
U
|
V
|
W
|
X
|
Y
|
Z
]
[
<-
0
1
2
3
4
5
6
7
8
9
->
]
Affiliation
Paper title
Federal University of Santa Catarina
Symbolic charge-based MOSFET model
 
Compact Modeling of Nonlinearities in Submicro...
 
Interrelations between Threshold Voltage Defin...
 
Charge-Based Formulation of Thermal Noise in S...
 
Consistency of compact MOSFET models with the ...
 
A Setup for Automatic MOSFET Mismatch Characte...
 
MOSFET threshold voltage: definition, extracti...
Federal University of Uberlandia
Comparison and Critical Analysis of Experiment...
Federal University of Viçosa
Synthesis and characterization of new nanopart...
FEE CTU in Prague
3D Electrostatic Energy Harvester
FEI Company
Optimization of Nano-Machining with Focused Io...
 
Advanced Particle Beam Technologies for Nano-C...
 
High resolution Nanolithography using Focused ...
 
New Characterisation Techniques for the Study ...
 
Advanced CryoTEM and Tomography for Two- and T...
 
Characterisation of Native-State Soft Matter u...
 
The Impact of Advanced S/TEM on Atomic-Scale C...
 
Advances in Automated 3D cortex image data acq...
 
Focused Ion Beam machining of large and comple...
FEI Electron Optics
Automated 3D cortex image data acquisition
© 2013 Nano Science and Technology Institute. All Rights Reserved.
Terms of Use
|
Privacy Policy
|
Contact Us
|
Site Map