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Nano Science and Technology Institute 1998 NSTI Nanotechnology Conference & Trade Show
Nanotech 98
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Nanotech 98 Technical Program - Wednesday April 8

Home Monday Tuesday Wednesday Authors

Keynote Lectures

Salons 4-5

Session chair: Bernard Courtois, TIMA-CMP

8:30 Breaking the Curse of Dimensionality: Efficient Techniques for Microsystem Modeling and Simulation
Prof. Selden B. Crary
University of Michigan, USA
Danish Technical University, Lyngby, Denmark
9:15 Visual Programming Environment for Modeling and Simulation
Prof. Ramiro Jordan
University of New Mexico

Break

10:00 - 10:20

Applications: Microfluidics 2

Salon 5

Session chair: Jay Zemel, University of Pennsylvania

10:20Computational Two-Dimensional Finite-Element Analysis of Flow Behavior Inside Microfluidic Amplifiers
E.W. Simoes, R. Furlan and J.N. Zemel
Escola Politecnica da Universidade de Sao Paulo
10:45Unsteady Gaseous Flows in Tapered Microchannels
C. Aubert, S. Colin and R. Caen
Laboratoire de Genie Mecanique de Toulouse
11:10Finite Element Approach for Reactive Microfluidic Devices
I-M Hsing and K.F. Jensen
Hong Kong University of Science and Technology
11:35Computational Modeling of Microfluid Devices with Free Surface Liquid Handling
H.Q. Yang and A.J. Przekwas
CFD Research Corp.

Characterization, Parameter Extraction, Calibration 2

Salon 4

Session chair: Gerhard Wachutka, Technical University of Munich

10:20Fast Inductance Extraction of 3-D Structures with Non-Constant Permeabilities
Y. Massoud and J. White
MIT
10:45Augmented Reality as an Interactive Tool for Microscopic Imaging, Measurement and Model Based Verification of Simulated Parts
A. Sulzmann, C. Schutz, H. Hugli and J. Jacot
EPFL
11:10Dynamic Measurements of Micro Sensors and Actuators Using Laser Doppler Vibrometry
A.C. Goding
Polytec PI, Inc.
11:35Simple Method of Characterizing CMOS Channel Doping Profiles Using CV Technique
D. Kapila, M. Kulkarni, C. Fernando, J. Davis, K. Vasanth and G. Pollack
Texas Instruments, Inc.

Lunch

12:00 - 13:20

Applications: Semiconductors 1

Salon 5

Session chair: Andreas Wild, Motorola

13:20The Influence of Space Quantization Effect on the Threshold Voltage Inversion Layer and Total Gate Capacitance in Scaled Si-MOSFETs
D. Vasileska and D.K. Ferry
Arizona State University
13:45Concurrent Process, Device and Integrated Circuit Development by Predictive Engineering for Smart Power Technologies
M. Bafleur, T. Dinh, H. Park, R. Thoma, T. Zirkle and A. Wild
LAAS/CNRS
14:10Simulations of a New CMOS Compatible Method to Enhance the Breakdown Voltage of Highly-Doped Shallow PN Junctions
A. Pauchard, P.A. Besse and R.S. Popovic
EPFL
14:35Hierarchical Approach to Simulation in a Verification System for the TriCore Microcontroller
E. Chesters, P. Coelho, Y-C Fu, M. Reddy, J. Madala, F. Wang and C. Salzmann
Siemens Microelectronics, Inc.

Discretization, Numerics, Computational Efficiency 2

Salon 4

Session chair: Per Ljung, Coyote Systems

13:20A Mixed Rigid/Elastic Formulation for an Efficient Analysis of Electromechanical Systems
D. Ramaswamy, N.R. Aluru and J. White
MIT
13:45Nodal Analysis for MEMS Simulation and Design
J. Clark, N. Zhou, S. Brown and K.S.J. Pister
UC-Berkeley
14:10The Wafeform IBiCG Accelerated Technique for Parallel Transient Simulation of Semiconductor Devices
T. Yang
Linkoping University
14:35Implications of Finite Time Stepping for Transient Sensor Models
M. Schubert and B. Gonzalez
Fachhochschule Regensburg

Break

15:00 - 15:20

Themal Modeling 1

Salon 5

Session chair: Sung-Kie Youn, Korea Advanced Institute of Science and Technology

15:20CSP Thermal Stress Simulation and Experimental Verification
Y.L. Xu, Q. Li and Y. Guo
Motorola, Inc.
15:45Small Signal Thermal Modeling of GaAs FETs Oriented to MMICs CAD Applying the Design Technique Based on Physical Parameters of the Foundry
A. Giorgio and A.G. Perri
Politecnico di Bari
16:10Reduced Electro-Thermal Models for Integrated Circuits
M. Furmanczyk, A. Napieralski, K. Szaniawski, W. Tylman and A. Lara
Technical University of Lodz
16:35Transient Characteristics of the FD SOI NMOSFET Including Self-Heating Effect
T-J Yoon, T-M Kim and J-W Park
Kumoh National University of Technology
17:00Elements for Modeling Sensitivity and Temperature Coefficient of Diffused Piezoresistors
D. Mladenovic, J. Hutchins and E. Tran
Motorola

Equivalent Circuits, Behavioral and Multilevel Simulation 1

Salon 4

Session chair: Bart Romanowicz, MIT

15:20Simulation of Mixed-Signal Systems in Standard VHDL
H. Gratz and W-J Fischer
Fraunhofer-Institute of Microelectronic Circuits and Systems
15:45Network Modeling of Micromachined Sensor Systems
G. Lorenz and R. Neul
Robert Bosch GmbH
16:10Simulation of Electrothermal MOS Circuits Using Saber
C.C. Liu, E.T. Carlen, K.D. Wise and C.H. Mastrangelo
University of Michigan
16:35Dynamic Modeling and Simulation of Microelectromechanical Devices with Circuit Simulation Program
T. Veijola, H. Kuisma and J. Lahdenpera
Helsinki University of Technology
17:00Modeling and Simulation of a Stiffness-Controlled Micro-Bridge Resonator
F. Verjus, E. Belhaire, T. Bourouina, N. Mauduit and A. Bosseboeuf
IEF-CNRS

17:00 Vendor and Publisher Exhibition ends

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