
	1998 NSTI Nanotechnology Conference & Trade Show

Nanotech 98 Technical Program - Wednesday April 8

Keynote Lectures

Salons 4-5

Session chair: Bernard Courtois, TIMA-CMP

8:30	Breaking the Curse of Dimensionality: Efficient Techniques for Microsystem Modeling and Simulation Prof. Selden B. Crary University of Michigan, USA Danish Technical University, Lyngby, Denmark
9:15	Visual Programming Environment for Modeling and Simulation Prof. Ramiro Jordan University of New Mexico

Break

10:00 - 10:20

Applications: Microfluidics 2

Salon 5

Session chair: Jay Zemel, University of Pennsylvania

10:20	Computational Two-Dimensional Finite-Element Analysis of Flow Behavior Inside Microfluidic Amplifiers E.W. Simoes, R. Furlan and J.N. Zemel Escola Politecnica da Universidade de Sao Paulo
10:45	Unsteady Gaseous Flows in Tapered Microchannels C. Aubert, S. Colin and R. Caen Laboratoire de Genie Mecanique de Toulouse
11:10	Finite Element Approach for Reactive Microfluidic Devices I-M Hsing and K.F. Jensen Hong Kong University of Science and Technology
11:35	Computational Modeling of Microfluid Devices with Free Surface Liquid Handling H.Q. Yang and A.J. Przekwas CFD Research Corp.

Characterization, Parameter Extraction, Calibration 2

Salon 4

Session chair: Gerhard Wachutka, Technical University of Munich

10:20	Fast Inductance Extraction of 3-D Structures with Non-Constant Permeabilities Y. Massoud and J. White MIT
10:45	Augmented Reality as an Interactive Tool for Microscopic Imaging, Measurement and Model Based Verification of Simulated Parts A. Sulzmann, C. Schutz, H. Hugli and J. Jacot EPFL
11:10	Dynamic Measurements of Micro Sensors and Actuators Using Laser Doppler Vibrometry A.C. Goding Polytec PI, Inc.
11:35	Simple Method of Characterizing CMOS Channel Doping Profiles Using CV Technique D. Kapila, M. Kulkarni, C. Fernando, J. Davis, K. Vasanth and G. Pollack Texas Instruments, Inc.

Lunch

12:00 - 13:20

Applications: Semiconductors 1

Salon 5

Session chair: Andreas Wild, Motorola

13:20	The Influence of Space Quantization Effect on the Threshold Voltage Inversion Layer and Total Gate Capacitance in Scaled Si-MOSFETs D. Vasileska and D.K. Ferry Arizona State University
13:45	Concurrent Process, Device and Integrated Circuit Development by Predictive Engineering for Smart Power Technologies M. Bafleur, T. Dinh, H. Park, R. Thoma, T. Zirkle and A. Wild LAAS/CNRS
14:10	Simulations of a New CMOS Compatible Method to Enhance the Breakdown Voltage of Highly-Doped Shallow PN Junctions A. Pauchard, P.A. Besse and R.S. Popovic EPFL
14:35	Hierarchical Approach to Simulation in a Verification System for the TriCore Microcontroller E. Chesters, P. Coelho, Y-C Fu, M. Reddy, J. Madala, F. Wang and C. Salzmann Siemens Microelectronics, Inc.

Discretization, Numerics, Computational Efficiency 2

Salon 4

Session chair: Per Ljung, Coyote Systems

13:20	A Mixed Rigid/Elastic Formulation for an Efficient Analysis of Electromechanical Systems D. Ramaswamy, N.R. Aluru and J. White MIT
13:45	Nodal Analysis for MEMS Simulation and Design J. Clark, N. Zhou, S. Brown and K.S.J. Pister UC-Berkeley
14:10	The Wafeform IBiCG Accelerated Technique for Parallel Transient Simulation of Semiconductor Devices T. Yang Linkoping University
14:35	Implications of Finite Time Stepping for Transient Sensor Models M. Schubert and B. Gonzalez Fachhochschule Regensburg

Break

15:00 - 15:20

Themal Modeling 1

Salon 5

Session chair: Sung-Kie Youn, Korea Advanced Institute of Science and Technology

15:20	CSP Thermal Stress Simulation and Experimental Verification Y.L. Xu, Q. Li and Y. Guo Motorola, Inc.
15:45	Small Signal Thermal Modeling of GaAs FETs Oriented to MMICs CAD Applying the Design Technique Based on Physical Parameters of the Foundry A. Giorgio and A.G. Perri Politecnico di Bari
16:10	Reduced Electro-Thermal Models for Integrated Circuits M. Furmanczyk, A. Napieralski, K. Szaniawski, W. Tylman and A. Lara Technical University of Lodz
16:35	Transient Characteristics of the FD SOI NMOSFET Including Self-Heating Effect T-J Yoon, T-M Kim and J-W Park Kumoh National University of Technology
17:00	Elements for Modeling Sensitivity and Temperature Coefficient of Diffused Piezoresistors D. Mladenovic, J. Hutchins and E. Tran Motorola

Equivalent Circuits, Behavioral and Multilevel Simulation 1

Salon 4

Session chair: Bart Romanowicz, MIT

15:20	Simulation of Mixed-Signal Systems in Standard VHDL H. Gratz and W-J Fischer Fraunhofer-Institute of Microelectronic Circuits and Systems
15:45	Network Modeling of Micromachined Sensor Systems G. Lorenz and R. Neul Robert Bosch GmbH
16:10	Simulation of Electrothermal MOS Circuits Using Saber C.C. Liu, E.T. Carlen, K.D. Wise and C.H. Mastrangelo University of Michigan
16:35	Dynamic Modeling and Simulation of Microelectromechanical Devices with Circuit Simulation Program T. Veijola, H. Kuisma and J. Lahdenpera Helsinki University of Technology
17:00	Modeling and Simulation of a Stiffness-Controlled Micro-Bridge Resonator F. Verjus, E. Belhaire, T. Bourouina, N. Mauduit and A. Bosseboeuf IEF-CNRS

17:00 Vendor and Publisher Exhibition ends

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