Environmental Digital Pulsed Force Mode AFM in Biomedical Coatings Research
Director, Characterization Facility,
Institute of Technology, University of Minesota
MiNTeC node of the National Nanotechnology Infrastructure Network
is technical staff member and director of the Characterization Facility (“CharFac”; www.charfac.umn.edu
), a core facility at the University of Minnesota; he is also a member of the graduate faculty of the Department of Chemical Engineering & Materials Science. The CharFac is part of the National Nanotechnology Infrastructure Network (nnin.org
), and is also affiliated with the University’s Materials Research Science and Engineering Center (MRSEC) and Industrial Partnership for Research in Interfacial and Materials Engineering (IPRIME). Dr. Haugstad received his B.A. in physics from Gustavus Adolphus College and Ph.D. in physics from the University of Minnesota. His doctoral research examined metal-semiconductor interfaces with synchrotron radiation photoelectron spectroscopy. After postdoctoral research with DuPont in the University’s Center for Interfacial Engineering, he joined the CharFac in 1994 focusing on atomic force microscopy (AFM) and ion beam analysis. His AFM research program has expanded to include (i) dynamics at polymeric surfaces, (ii) the structure and properties of thin films (polymer, surfactant, biological), and (iii) contrast mechanisms in AFM including special methods. He has over sixty publications and is a frequent participant in multidisciplinary symposia and workshops with the common thread of AFM methods and nanotribology. He collaborates with companies on soft technologies spanning personal care, ocular and biomedical industries; he also has academic research in biofilms and crystalline organic semiconductors. His teaching includes a graduate course in materials characterization; lab instruction for undergraduates; adjunct teaching for technical college students; training CharFac users; and short courses in CharFac techniques.
Teaching the workshop on Nanoscale Characterization Techniques and Applications.
Co-chairing the special symposium on Nanoscale Characterization.