Charge-based compact modeling techniques for nanoscale Multi-Gate MOSFETs

B. Iñiguez, F. Lime, A. Lázaro, O. Moldovan, B. Nae
Universitat Rovira i Virgili, ES

Keywords: compact modeling, Multiple-Gate MOSFETs, small-signal modeling, RF modeling, noise modeling

Abstract:

We review an advanced charge-based compact modeling framework which has been successfully applied to different types of multiple-gate MOSFETs: symmetrical and assymetrical Double-Gate MOSFETs, cylindrical Gate All Around MOSFETs and FinFETs.