Nanoscale Characterization Techniques and Applications
Sunday June 1, 2008, 8:00 am - 6:00 pm, Boston, Massachusetts
The focus of this course is nanoscale characterization techniques and applications with a particular emphasis on Atomic Force Microscopy, and the use of X-Ray light.
Nanoscale Characterization with Atomic Force Microscopy
- Principles of imaging surfaces with AFM
- Quasistatic and dynamic modes
- Metrics of surface topography
Compositionally sensitive methods (1.5h)
- Shear forces, characterizing crystallinity and disorder
- Phase imaging for high spatial resolution; physical interpretations
- Distance-dependent forces; liquid environments and chain molecules
Advanced methods (1h)
- Spatially resolved distance-dependent forces for high information content
- Environmental AFM (variable T and RH)
- Physical property analysis (tribological, mechanical, electromagnetic)
Who should attend?
The course is aimed at students, scientists (chemistry, physics, materials, biology) and engineers (chemical, mechanical, biomedical) in research and development of processes involving soft materials, polymer/surfactant thin films, natural and synthetic biomaterials, polymeric coatings and composites, organic semiconductors.
Characterization of sub micron size objects using x-ray light
- Advantages and drawbacks of x-ray light
- Principles of small angle xray scattering
- Main field of applications
X-ray sources: modern laboratory versus synchrotron
- Experimental setup
- Optics, detectors, sample environment
Main body (1.5h)
- Data analysis
- Instrumental correction: absolute intensity often matters!
Application to nanotechnology
- Principal models
- Critical dimensions determination
- Where micro-structure meets molecular architecture: Combined SAXS and WAXS
- When surface organization can be probed as an ensemble: Grazing incidence SAXS
- Pushing the limits toward the micron regime: Ultra SAXS
Who should attend?
The course is aimed at students, scientists (chemistry and physics) and engineers (chemical -mechanical) in research and development of processes involving fine particles, soft materials, cosmetics, liquids, surfactants, biological and proteins solutions, polymeric films, ordered nano-objects as such as gratings, self-organized molecular super architectures, pyrolitic particles.
Greg Haugstad is technical staff member and director of the Characterization Facility (“CharFac”; www.charfac.umn.edu), a core facility at the University of Minnesota; he is also a member of the graduate faculty of the Department of Chemical Engineering & Materials Science. The CharFac is part of the National Nanotechnology Infrastructure Network (nnin.org), and is also affiliated with the University’rsquo;s Materials Research Science and Engineering Center (MRSEC) and Industrial Partnership for Research in Interfacial and Materials Engineering (IPRIME). Dr. Haugstad received his B.A. in physics from Gustavus Adolphus College and Ph.D. in physics from the University of Minnesota. His doctoral research examined metal-semiconductor interfaces with synchrotron radiation photoelectron spectroscopy. After postdoctoral research with DuPont in the University’rsquo;s Center for Interfacial Engineering, he joined the CharFac in 1994 focusing on atomic force microscopy (AFM) and ion beam analysis. His AFM research program has expanded to include (i) dynamics at polymeric surfaces, (ii) the structure and properties of thin films (polymer, surfactant, biological), and (iii) contrast mechanisms in AFM including special methods. He has over sixty publications and is a frequent participant in multidisciplinary symposia and workshops with the common thread of AFM methods and nanotribology. He collaborates with companies on soft technologies spanning personal care, ocular and biomedical industries; he also has academic research in biofilms and crystalline organic semiconductors. His teaching includes a graduate course in materials characterization; lab instruction for undergraduates; adjunct teaching for technical college students; training CharFac users; and short courses in CharFac techniques.
European Synchrotron Radiation Facility
Soft condensed matter group
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