Advanced X-ray techniques for semiconductor nanostructures: from ensemble average to single object properties
	Till H. Metzger Senior Scientist European Synchrotron Radiation Facility (ESRF) Grenoble, France

Dr. Till H. Metzger  is a senior scientist at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France,  where he is responsible for the “Anomalous scattering beamline ID01”.  He received his Ph.D. from the Technical University in Munich in 1975. From 1982 to 1984 he worked as associate scientist at the Brookhaven National Lab, Upton New York, doing research on gases in metals. He returned to the University of Munich in 1985, where he stayed until 1999. During this time he concentrated his research interest on structural characterisation of semiconductors, i. e. multilayers, defects, quantum wells and quantum dots. After a short sabbatical stay at Stanford University (1999),  he joined the ESRF in 2000. His current research interest covers science on the nanometre scale using advanced X-ray scattering methods to characterise mainly semiconductor nanostructures. He is an expert in the development and application of x-ray scattering techniques to study nanostructured thin films. He has published more than 240 articles in peer reviewed journals.

Speaking the special symposium on Nanoscale Characterization.