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Benchmarking Performance and Physical Limits of Processing Electronic Device and Systems: Solid-State and Molecular Paradigms
S.E. Lyshevski, V. Shmerko, S. Yanushkevich
Rochester Institute of Technology, US
Keywords:
electronics, performance, processing platforms
Abstract:
We study physical limits and research performance estimates. The designer examines the device and system performance and capabilities using distinct performance measures, estimates, indexes and metrics. At the device level, we examine functionality, study characteristics and estimate performance of 3D-topology Mdevices.
Nanotech 2008 Conference Program Abstract
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