2008 NSTI Nanotechnology Conference and Trade Show - Nanotech 2008 - 11th Annual

Partnering Events:

TechConnect Summit
Clean Technology 2008

Advanced Scanning Probe Microscope for Integrated SPM - Optical Spectroscopy Solutions.

S. Bashkirov, A. Belyaev, D. Evplov, V. Gavrilyuk, V. Ivanov, A. Krayev, M. Savvateev, A. Temiryazev, V. Zhizhimontov, S. Saunin
AIST-NT Inc, US

Keywords:
AFM, SPM, Raman Spectroscopy, TERS, SERS

Abstract:
AIST-NT developed new advanced Scanning Probe Microscope designed to be integrated with Raman and UV-VIS spectrometers. AIST-NT’s SPM features fully automated AFM head with optical access from top, side and bottom; 1300nm registration laser; best in industry flexure scanner and advanced digital controller. Unique properties of AIST-NT’s SPM and AFM-Nano Raman systems open new possibilities in advanced SPM characterization of semiconductors including high resolution TERS-assisted strain mapping, SPM and TERS analysis of polymers and biological samples and other nano-structured materials; photonic crystals and SERS devices and many other novel materials and nanostructures.


Nanotech 2008 Conference Program Abstract