2008 NSTI Nanotechnology Conference and Trade Show - Nanotech 2008 - 11th Annual

Partnering Events:

TechConnect Summit
Clean Technology 2008

High speed Atomic Force Microscopy for imaging Cell-Virus interactions

G.E. Fantner, D.S. Gray, I.W. Rangelow, A.M. Belcher
Massachusetts Institute of Technology, US

Keywords:
high speed atomic force microscopy, cell-virus interactions

Abstract:
AFM has proven to be a valuable tool for taking high resolution images of biological samples such as cells and viruses. Although these images yield valuable information about the static properties of the samples, these images give little information about the dynamic behavior of the samples. This is mainly due to the long time it takes to acquire an AFM image. Interesting processes happen in seconds or faster, and this is very fast compared to the several minutes it takes to record an AFM image. In our lab we have built an integrated high speed AFM designed for general applications in life science. The requirements on this instrument are that it be as easy to use as a conventional AFM and deliver similar quality images with a scan size larger than 10um at a rate of several images per second. This required a redesign of all AFM components optimized for speed and noise performance. A scanner designed for high resonance frequencies is combined with small cantilevers with MHz resonance frequencies and band with optimized feedback control. The development of this instrument is motivated by the desire to study cell-virus infection events as well as phage templated formation of mineralized nanowires. This requires an image acquisition time of below 1s while retaining single nanometer resolution.


Nanotech 2008 Conference Program Abstract