2008 NSTI Nanotechnology Conference and Trade Show - Nanotech 2008 - 11th Annual

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TechConnect Summit
Clean Technology 2008

Modeling of gain in advanced CMOS technologies

A. Spessot, F. Gattel, P. Fantini, A. Marmiroli
STMicroelectronics, IT

Keywords:
gain, mobility, strain

Abstract:
The impressive downscaling of CMOS technology and its more and more massive introduction in System-on-chip (SoC) oriented applications require comprehensive modeling approach able to describe such different world (digital and analog) starting from a single technological platform. In this pape we deep insight the modeling of gain, a key parameter ruling the analog performances of advances CMOS technologies, in relation with their layout dependence affected by the shallow trench isolation induced mechanical stress.


Nanotech 2008 Conference Program Abstract