2007 NSTI Nanotechnology Conference and Trade Show - Nanotech 2007 - 10th Annual
Technical Conferences
Nano Electronics & Photonics
Nano Fabrication
MEMS & NEMS
Sensors & Systems
Micro & Nano Fluidics
MSM - Modeling Microsystems
WCM - Compact Modeling
Nanostructured Materials & Devices
Soft Nanotechnologies & Applications
Nanoparticles in Soft Materials - Colloidal Systems
Polymer Nanotechnology
Carbon Nano Structures & Devices
Nano Particles & Applications
Composites & Interfaces
Energy Technologies & Applications
Nanotech in Health, Environment & Society
ICCN - Nanoscale Modeling
Nanoscale Characterization
Homeland Security
Bio Nano Materials & Tissues
Bio Sensors & Diagnostics
Biomarkers & Nanoparticles
Cancer Diagnostics, Imaging & Treatment
Drug Delivery & Therapeutics
Nano Medicine
Nanotech to Neurology
TechConnect Summit - IP Matchmaking
Cleantech 2007
Industrial Impact Workshop
Program Committee

Nanoscale Characterization

Nanoscale Characterization

Symposium Chairs

Pierre Panine Pierre Panine
E.S.R.F.
European Synchrotron Radiation Facility, Soft condensed matter group, Grenoble, France
Greg Haugstad Seeing and feeling nano with intermittent-contact AFM: it’s all in the details
Greg Haugstad
Characterization Facility, University of Minnesota, MiNTeC node of the National Nanotechnology Infrastructure Network, US

Confirmed Invited Speakers

Scott Sills Understanding and Utilizing Molecular Constraints in Nanoscale Material Designs
Scott Sills
Micron Technology, Inc.
Francois Rieutord The MINATEC Nanoscale Characterization Centre. Comprehensive and complementary analysis tools for nanoelectronics
François Rieutord
Nanostructure and Synchrotron Radiation Laboratory, CEA, France
Alain Gibaud SAXS, X-ray reflectivity and GISAXS
Alain Gibaud
Laboratoire de Physique de l’Etat Condensé
Université du Maine, Le Mans, France
Moonhor Ree Quantitative Synchrotron Grazing Incidence X-ray Scattering and Reflectivity Analysis of Nano-structures and Patterns Supported with Substrates Moonhor Ree
Polymer Synthesis & Physics Laboratory
Pohang University of Science and Technology, Korea

Symposium Sessions

 

Monday May 21

7:00 Registration
8:30 Nanotech Conference Opening & Keynotes
10:30 Nanoscale Characterization: Indirect Space Methods: non-destructive and non-invasive observation
1:30 Nanoscale Characterization: Indirect Space Methods: non-destructive and non-invasive observation
4:00 Nanoscale Characterization: Spectroscopy and electrical: electronics & bonding
4:20 NanoFab: Nanofabrication Equipment, Imaging & Characterization
 

Tuesday May 22

7:00 TUESDAY - Registration
4:00 Poster Session 1 (4:00 - 6:00) & Expo Reception
 

Wednesday May 23

8:30 Nanoscale Characterization: Force characterization: push, pull, bend
1:00 Nanoscale Tools
2:00 Nanotech Poster Session 2 - Expo Reception (2:00 - 4:00)
4:00 Nanoscale Characterization: Soft Nanotechnology
 

Thursday May 24

10:30 Nanoscale Characterization: Imaging and Profiling: applications to nano
 

Symposium Program

 

Monday May 21

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7:00 RegistrationMain Lobby
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8:30 Nanotech Conference Opening & KeynotesGrand Ballroom
 Session chair: Bart Romanowicz, NSTI, Andreas Wild, Freescale Semiconductors
8:30 How the US Can Ensure Energy Supply for the Future
J. Hofmeister, Shell Oil, US (bio)
9:10 National Nanotech Initiative and Industrial Nanotechnology Impact
A.H. Carim, Co-Chair, Nanoscale Science and Engineering Technology, Subcommittee, National Science & Technology Council, U.S. Department of Energy, US (bio)
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10:30 Nanoscale Characterization: Indirect Space Methods: non-destructive and non-invasive observationGreat America K
 Session chair: Pierre Panine, ESRF, FR
10:30 SAXS, X-ray reflectivity and GISAXS (invited overview presentation)
A. Gibaud, Universite du Maine - Le Mans, FR
11:00 Quantitative Synchrotron Grazing Incidence X-ray Scattering and Reflectivity Analysis of Nano-structures and Patterns Supported with Substrates
M. Ree, J. Yoon, K. Heo, K.S. Jin, S. Jin, B. Lee, I. Park, S.C. Choi, G. Kim, H. Kim, W. Oh, Y-H Park, Y. Hwang, J-S Kim, J. Kim, K-W Kim and T. Chang, Pohang University of Science & Technology, KR
11:20 MikroGap Detector Technology Applied to Small Angle X-ray Scattering
K. Erlacher, D. Khazins and R. Durst, Bruker-AXS Inc., US
11:40 3D structure of nano-scale materials by total x-ray scattering
V. Petkov, Central Michigan University, US
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1:30 Nanoscale Characterization: Indirect Space Methods: non-destructive and non-invasive observationGrand Ballroom B
 Session chair: Pierre Panine, ESRF, FR
1:30 Applications of X-ray Measurement Techniques in Nano-Scale Semiconductor Device Manufacturing
D. Agnihotri, Jordans Valley Semiconductors, US (bio)
2:00 Determination of micro-structural properties with x-ray absorption fine structure
S.-W. Han, S.-H. Park, H.-J. Yu, E.-S. Jeong, S.-H. Kim, Y.-J. Kim and G.-C. Yi, Chonbuk National University, KR
2:20 Ellipsometry Porosimetry : Fast and non destructive method of porosity characterization of cubic mesoporous TiO2 thin films .
C. Defranoux, J.P. Piel, A. Bondaz and L. Kitzinger, SOPRA-SA, FR
2:40 Nanoparticle Formation in Supercritical Fluids – The World’s First Real Time In-situ Investigation
H. Jensen, M. Bremholm, R.P. Nielsen, K.D. Joensen, Y-S Chen, J. Almer, E.G. Søgaard, B.B. Iversen and S.B. Iversen, SCF-Technologies, DK
3:00 Lattice Engineered Nanoparticles.
P. Casey, C.J. Rossouw, A.B. Murphy and C. Bell, Commonwealth Scientific and Research Organisation, AU
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4:00 Nanoscale Characterization: Spectroscopy and electrical: electronics & bondingGrand Ballroom B
 Session chair: Pierre Panine, ESRF, FR
4:00 Analytical Methods for Nanotechnology
I.A. Mowat, J. Moskito, I Ward and A. Hartzell, Evans Analytical Group, US
4:20 How to SPION Glass Transitions
M. Concha, S. DeLong, L. Radu, C. Kumar and P. Bidwell-Hanson, University of New Orleans, US
4:40 Near-Field Raman and Luminescence Spectroscopies to evidence chemical heterogeneity of surfaces with sub-wavelength spatial resolution.
B. Humbert, J. Grausem, M. Dossot and S. Cremel, LCPME UMR 7564 CNRS-UHP, FR
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4:20 NanoFab: Nanofabrication Equipment, Imaging & CharacterizationGreat America 2
 Session chair: Andres H. La Rosa, Portland State University and Stanley Pau, University of Arizona
4:20 Correlated roughness in polymer film containing magnetic nanoparticles
M.M. Abul Kashem, J. Perlich, L. Schulz, S.V. Roth and P. Müller-Buschbaum, Technische Universität München, DE
4:40 An All-Digital Cantilever Controller for MRFM and Scanned Probe Microscopy using a Combined DSP/FPGA Design
D. de Roover, L.M. Porter II, A. Emami-Naeini, J.A. Marohn, S. Kuehn, S. Garner and D.D. Smith, SC Solutions, Inc., US
5:00 Highly sensitive Scanning Capacitance Microscope
H. Tanbakuchi, Agilent Technologies, US
5:20 Confocal Raman AFM, a powerful tool for the nondestructive characterization of heterogeneous materials
U. Schmidt, F. Vargas, M. Kress, T. Dieing, K. Weishaupt and O. Hollricher, WITec GmbH, DE
5:40 Nano Equipment and Materials for Electronics - Market Needs and Outlook
L. Sheet, SEMI, US
 

Tuesday May 22

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7:00 TUESDAY - RegistrationMain Lobby
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4:00 Poster Session 1 (4:00 - 6:00) & Expo ReceptionExhibit Hall
 

Wednesday May 23

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8:30 Nanoscale Characterization: Force characterization: push, pull, bendGrand Ballroom H
 Session chair: Pierre Panine, ESRF, FR and Greg Haugstad, University of Minnesota, US
8:30 The MINATEC Nanoscale Characterization Centre: Comprehensive and complementary analysis tools for nanoelectronics
F. Rieutord, Center for Atomic Energy - Grenoble, FR
9:00 The Casimir Force and quantum interaction between conducting macro-bodies at nanoscale distances
V. Petrov, M. Petrov, V. Bryksin, J. Petter and T. Tschudi, Darmstadt Technical University, DE
9:20 Nanoscale Deformation Measurements for Reliability Assessment of MEMS and NEMS
J. Keller, D. Vogel and B. Michel, Fraunhofer Institute for Reliability and Microintegration (IZM), DE
9:40 Effective Use of Focused Ion Beam (FIB) in Investigating Fundamental Mechanical Properties of Metals at the Nano-Scale.
J.R. Greer and W.D. Nix, Palo Alto Research Center, US
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1:00 Nanoscale ToolsGrand Ballroom G
 Session chair: John Tucker, Keithley Instruments
1:00 Avoiding self-heating effects and measurement errors on nanoscale devices using Pulse I-V techniques
J. Tucker, KeithleyInstruments, Inc., US
1:20 Computer aided design of nano-scale technologies
K. Stokbro, Atomistix, US
1:40 Electronic and magnetic transport measurements with probe stations
J. Lindemuth, Lake Shore Cryotronics, US
2:00 Nanopositioners – An essential part of the nanotechnology toolkit
J.F. MacKay, Mad City Labs, US
2:20 Attributes of DPN® – compelling nanotechnology; Unique Advantages of NSCRIPTOR™
J. Haahein, Nanoink, US
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2:00 Nanotech Poster Session 2 - Expo Reception (2:00 - 4:00)Exhibit Hall
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4:00 Nanoscale Characterization: Soft NanotechnologyGrand Ballroom E
 Session chair: Greg Haugstad, University of Minnesota, US
4:00 Understanding and utilizing molecular constraints in nanoscale material designs
S. Sills and R.M. Overney, Micron Technology, Inc., US (bio)
4:30 Seeing and feeling nano with intermittent-contact AFM: it’s all in the details (invited overview presentation)
G. Haugstad, University of Minnesota, US (bio)
5:00 Advanced CryoTEM and Tomography for Two- and Three-Dimensional Nano-Characterisation of Soft Matter
E. Sourty, F. de Haas, P.M. Frederik, J. Loos, D.J. Stokes and D.H.W. Hubert, FEI Company, NL
5:20 Characterisation of Native-State Soft Matter using ‘Multi-Mode’ Electron Microscopy
D.J. Stokes, E. Baken, B.H. Lich and D.H.W. Hubert, FEI Company, NL
 

Thursday May 24

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10:30 Nanoscale Characterization: Imaging and Profiling: applications to nanoRoom 209
 Session chair: Greg Haugstad, University of Minnesota, US
10:30 Accommodation of Characterization Tools
L. York, Abbie Gregg, Inc., US
11:00 The Impact of Advanced S/TEM on Atomic-Scale Characterisation and Analysis
D.H.W. Hubert, B. Freitag and D.J. Stokes, FEI Company, NL
11:20 In-situ Gas Injection-Heating Atomic Resolution TEM for Nanomaterials
X.F. Zhang, Hitachi High Technologies America, Inc., US
11:40 Image-based Nanocrystallography in Two and Three Dimensions with open-access database support
P. Moeck, R. Bjorge and P. Fraundorf, Portland State University, US
12:00 Multi-frequency, repulsive-mode amplitude-modulated atomic force microscopy imaging mode
R. Proksch, J. Cleveland, J. Li and A. Moshar, Asylum Research, US
12:20 Characterisation of Electrical Fields of Buried Interdigitated Nanoscale Ti-Electrode Arrays by a Novel Atomic Force Microscopy Measurement Procedure and Their Fabrication by FIB Milling
M.G. Jenke, Ch. Santschi and P. Hoffmann, EPFL (Ecole Polytechnique Fédérale de Lausanne), CH
 

Special Symposium

Characterization is a cornerstone to nanoscale advancements, both in physical and life sciences. This symposium targets a wide range of nanoscale characterization techniques including microscopy, scattering, spectroscopy/spectrometry, nanomechanical and other tools, along with specimen preparation methods and handling. It is essential that this burgeoning knowledge base be transparently presented to the broad nanotechnology community. NSTI will use this event to promote the rapid education, dissemination, and commercialization of new characterization techniques into industries based in both physical and life sciences. The symposium seeks to introduce general technique types to newcomers, report pioneering methods, and drill down into new physical understandings, all the while emphasizing applications useful to industrial engineers and technicians.

Advances in characterization include not only far-field probes (e.g., beams of electrons, ions, neutrons or photons) and near-field probes (indentors, nanotips, fibers and nanotubes), but also a growing intellectual component whereby data are manipulated, analyzed, rendered and simulated to yield meaningful information. As some tools and methods have become more common and practical, certain misunderstandings and misinterpretations also have crept into the lexicon. Thus this symposium will include an element of “methods training” to promote the insightful application of characterization tools in nanotechnology R&D.

We encourage your participation in this event and community, through your comments, suggestions and offers for assistance in review and organization. Please contact the symposium coordinator with your comments.

Topics & Application Areas

Online abstract submissions are now being accepted. Proposed topics include, but are not be limited to:

  • Direct space imaging methods
    TEM, SEM, AFM, near-field optical, X-ray microscopy, topography and tomography, spatially resolved ion mass spectrometry, depth profiling with ions…
  • Indirect space methods
    X-ray, neutron and light scattering...
  • Spectroscopy
    NMR, FTIR, Raman, acoustic, dielectric spectroscopy...
  • Mechanical properties
    Nanometrology, nanotribology, nanoindentation...
  • Rheology, solutions and processing
  • Microfluidics
    Coupled techniques with lab-on-a-chip
  • Sample preparation and control
    Thermalization, positioning, connecting...

A special joint session with the Soft Nanotechnology and Polymer Nanotechnology symposia will be devoted to Characterization of Soft Nanostructured Materials.

A special joint session with the Bio Sensors & Diagnostics symposium will be devoted to Characterization for Biomedical Applications.

Journal Submissions

Journal of Experimental Nanoscience

Journal of Experimental Nanoscience

Selected Nanotech Proceedings papers will be reviewed and invited into a Special Issue of the Journal of Experimental Nanoscience. The journal provides a showcase for advances in the experimental sciences underlying nanotechnology and nanomaterials.

For consideration into this Special Issue of the Journal of Experimental Nanoscience, please select the “Submit to Journal of Experimental Nanoscience” button during the on-line submission procedure. You may only select a single journal during the submission process.

Conference Quick Links

 
 

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This event is not open to the general public and NSTI reserves the right to refuse admission and participation to any individual.