2007 NSTI Nanotechnology Conference and Trade Show - Nanotech 2007 - 10th Annual

Taylor Hobson Ltd

Taylor Hobson Ltd

“For more than 20 years Taylor Hobson has been a leader in interferometer-based metrology. Our deep understanding of optical systems and computational mathematics led to the 2003 introduction of “Closed Coherence Interferometry” which marked a turning point in the capability of optical profilers. With sub-angstrom resolution, more than 1,000,000 data points and stunning 3D graphics, our Talysurf CCI delivers levels of performance never before seen in production instruments.

Taylor Hobson currently has 65 active patents and 17 patents pending. Precision manufacturers the world over rely on our metrology expertise to solve their most demanding dimension, form and texture measurement applications.”

Booth: 519

Web site:
http://www.taylor-hobson.com/

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