2007 NSTI Nanotechnology Conference and Trade Show - Nanotech 2007 - 10th Annual

Optimal Skew Corners for Compact Models

N. Lu
IBM, US

Keywords:
statistical model, skewing in compact model, corner model

Abstract:
We present an innovative approach to generate an optimal skew corner of a compact device model (e.g., a Spice model) for a single performance target, and to generate a common/optimal skew corner of a compact model for multiple performance targets. Each statistical parameter of the model is properly skewed within its tolerance range in such a way that the model will reproduce the fast or slow corner results of one or multiple performance targets while maximizing the joint probability density. The existance conditions of a common/optimal corner are analyzed. The corner model problem of N targets and M statistical model parameters is analyzed based on the sensitivities in the first-order approximation. Explict equations are given, and explicit corner model solution are provided. After obtaining the first-order solution, we further construct a 2nd-order (i.e., quadratic response surface) approximation to the performance targets. Then, we use the above first-order solution as the starting point of an iteration solution process to solve a set of non-linear (say, quadratic) equations. In this approach, we obtain a set of more accurate corner solution.

Back to Program

Sessions Sunday Monday Tuesday Wednesday Thursday Authors Keywords

Nanotech 2007 Conference Program Abstract

 
 

Names, and logos of other organizations are the property of those organizations and not of NSTI.
This event is not open to the general public and NSTI reserves the right to refuse admission and participation to any individual.