2007 NSTI Nanotechnology Conference and Trade Show - Nanotech 2007 - 10th Annual

Microstructures and Physical Properties of Nanostructured Invar

J.K. Kim, J.H. Seo and Y.B. Park
Sunchon National University, KR

Keywords:
electroforming, grain growth, invar, OLED, texture, thermal expansion

Abstract:
Fine metal masks (FMMs) are necessarily used in the process to produce organic light-emitting displays (OLEDs), and should be made of materials with low thermal expansion in order to guide evaporated luminescent materials into correct positions on glass-substrates. Invar (Fe-36%Ni alloy), whose thermal expansion coefficient (TEC) approaches zero, is the most appropriate material for the application. In the present work, FMMs of nanocrystalline Invar were fabricated by using an electroforming method. The present study has been aimed at clarifying correlation between the microstructures and physical properties which evolve during annealing in the nanostructured Invar. The TEC measured about 1.14x10-6/K in the as-deposited sample consisting of nanometer-sized grains. Grain growth took place during annealing at temperatures higher than 350oC, and the annealed specimen revealed the TEC of conventional Invar, i.e. about 2.01x10-6/K. Mechanical properties also significantly changed after annealing. The evolution of microtextures during annealing was systematically investigated by means of the orientation imaging microscopy (OIM) analysis. Physical properties depending on the microstructures will be discussed in terms of the crystallographic orientation dependence.

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