2007 NSTI Nanotechnology Conference and Trade Show - Nanotech 2007 - 10th Annual

NanoToolbox

E.J. Cox, K.S. Yeong and Y.C. Loke
Institute of Materials research and Engineering, SG

Keywords:
Nano, SPM, AFM, Cantilever

Abstract:
This work incorporates several novel ideas for use within Scanning Probe Microscopy (SPM), which as a whole can be considered as a ‘NanoToolbox’. The work involves combining our existing MEMS and optical device capability to construct useful “nanoscale tools” for SPM. The research explores unique technologies, such as new tip designs, functionalised tips employing mass fabrication methods (AFM and STM), integrated optics in AFM cantilevers (removing the requirement for laser alignment).

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Nanotech 2007 Conference Program Abstract

 
 

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