Nanotechnology Conference and Trade Show - Nanotech 2006
> Program > Technical Conferences > Business & Development > Nano Impact Workshop > Nanotech Job Fair > Expo
Program
Sessions
Sunday
Monday
Tuesday
Wednesday
Thursday
Index of Authors
Index of Keywords
Confirmed Speakers
Conferences & Symposia

Conference Proceedings

Conference Technical Proceedings

Frequency Tuning of Micro-beams using Electrostatic Pull-in

J.S. Burdess, A.J. Harris and S. Kafumbe
University of Newcastle, UK

Keywords:
micro cantilever, frequency tuning, pull-in, voltage control

Abstract:
The work reported shows how the frequency of vibration of simple beam structures can be changed significantly through the action of electrostatic pull-in. The application of a voltage between the beam and a supporting, but insulating, substrate will eventually cause the beam to become attached to the substrate. This changes the supporting conditions and thus the free length of the beam and thus its natural frequency.A theory, which is developed using variational methods, is described and this identifies three different stable states of static deflection.For the final state, it is shown that the change in the frequency of free vibration is proportional to applied voltage and that increases in frequency, of up to an order of magnitude greater than the initial frequency, can be achieved.
 
Micro-cantilevered beams, fabricated from gold using electro-deposition, are used to test the efficacy of this approach. An overview of the experiment is presented and it is shown how the dynamic characteristics of the beams, at different pull-in voltages, are derived from Laser Doppler vibrometry measurements. The results of the tests are presented and it is shown that the pull-in procedure provides a non destructive way of actively changing the natural frequency of a simple elastic structure

Back to Program

Sessions Sunday Monday Tuesday Wednesday Thursday Authors

Nanotech 2006 Conference Program Abstract

 
Nanotechnology Conference | Terms of use | Privacy policy | Contact | NSTI Home
Program | Technical Conferences | Business & Development | Nano Impact Workshop | Nanotech Job Fair | Expo |
Nanotech 2006 Home | Press Room | Venue | Subscribe | Site Map
Names, and logos of other organizations are the property of those organizations and not of NSTI.
This event is not open to the general public and NSTI reserves the right to refuse admission and participation to any individual.