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Thermal Noise and Bit Error Rate Limits in Nanoscale Memories

L. Forbes, M. Mudrow and W. Wanalertlak
oregon state university, US

Keywords:
noise, error rates, nanoscale memories

Abstract:
Analysis of the effects of thermal noise in nanoscale memories is presented. A theoretical analysis of thermal noise is used to predict the number of bit errors per year caused by thermal noise.

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