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Three-Dimensional Atom Mapping for Nanotechnology Applications with Atom Probe Tomography

T. Kelly
Imago Scientific, US

Keywords:
Atom Mapping, Tomography, Probe

Abstract:
Atom probe tomography is the highest spatial resolution analytical technique. It provides three-dimensional structural and compositional analysis of materials at the atomic scale. With recent developments in LEAP® technology by Imago Scientific Instruments, the atom probe’s compositional imaging capabilities are now accessible to non-experts for analysis of a wide variety of materials including metals, magnetic media, semiconductors, ceramics, geological materials, synthetic organics and polymers, and biological materials. Imago’s atom probe technology has many advantages in analysis speed, large field of view, and ease of operation. The LEAP 3000X™ accomplishes these objectives while incorporating the ability to field evaporate the specimen atom by atom with either a laser pulse or a voltage pulse. Imago’s reflectron-based atom probe technology (from Oxford nanoScience) offers the highest attainable mass resolution for voltage pulsed instruments. Important examples of analyses of metals, semiconducting, and organic nanostructures will be shown.

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