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Nanoscale Characterization using DPI

J. Maltby
Farfield Sensors, US

Keywords:
nanoscale characterization, DPI

Abstract:
Nanoscale characterisation remains a key aspect in the general development of nanotechnology as in order to engineer nanostructures it is essential that they can be measured. Most existing techniques provide steady state end point data on the condition of structures/surfaces at the nanometer scale. Efficient process development requires not only the ability to measure the steady state structures but also the ability to measure the real time processes which lead the final products. In this paper we report on the use of DPI to measure the complete process of depositing molecular layers at the interface and determining their subsequent function. We report on the use of lipid structures as model structures which can be manipulated at the solid liquid interface. Results are presented in which nanoscale structures are manipulated in real time simply by changing deposition conditions, concentrations etc. This approach offers the clear potential to control the growth of molecular (nano) structures in real time and thus to influence their overall function.

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