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Visualizing and manipulating the building blocks of nanotechnology with the Atomic Force Microscope

J. Thornton
Veeco, US

Keywords:
AFM, Tool, Nanoscale

Abstract:
John Thornton has 12 years of AFM applications experience with Veeco Instruments. He is currently located in our east coast applications office in Chadds Ford, PA. His educational background consists of a B.S. in Geology from Virginia Polytechnic Institute and State University (Virginia Tech), and a M.S. in Materials Science and Engineering at North Carolina State University where he concentrated on materials characterization by AFM and other analytical techniques.

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