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Pulse Testing for Better Measurements of Nanodevices

J. Tucker
Keithley Instruments, US

Keywords:
nanoscale, characterization, pulse testing, nanodevices

Abstract:
With new materials, shrinking device dimensions, and higher operating speeds, electrical characterization is more challenging than ever. Faster electronics are a common goal among many areas of nanodevice and nanomaterial research. Traditional DC methods cannot adequately test fast electronic properties that are the main objective. Devices on the nanoscale are also prone to self-heating or joule-heating when too much power is applied to materials and devices. Even currents as low as nanoAmps can cause self-heating. High speed voltage or current pulse sourcing and measuring can be used to characterize devices with very low power, minimizing the problem of self-heating that can affect device response and skew test results. Pulse characterization testing on unpackaged or experimental devices can be used to better predict final, packaged device performance and their usefulness in high-speed circuits.

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