Nanotechnology Conference and Trade Show - Nanotech 2006
> Program > Technical Conferences > Business & Development > Nano Impact Workshop > Nanotech Job Fair > Expo
Program
Sessions
Sunday
Monday
Tuesday
Wednesday
Thursday
Index of Authors
Index of Keywords
Confirmed Speakers
Conferences & Symposia

Conference Proceedings

Conference Technical Proceedings

VHDL Simulation considering Single Event Upsets (SEUs)

M. Grecki
Technical University of Lodz, PL

Keywords:
SEU, VHDL, simulation

Abstract:
The SEEs can be destructive for semiconductor devices, however non-destructive SEE called SEU ( Single Event Upsets) resulting of bit flips seems to be the main problem. Due to reduction of feature size the SEUs play an increasing role in failures observed during operation of digital circuits, particularly in environments with remarkable radiation level (avionics, nuclear industry, High Energy Physics instrumentation etc.). The special design methods, based on hardware and software redundancy, allow to detect and correct radiation influenced SEUs during system operation, making such a system radiation-tolerate.
This paper presents the SEUSIM software library and method of VHDL model conversion that allow to simulate the operation of digital circuit taking into account SEUs. The library is written in pure VHDL so it can be used by most VHDL simulators.
The simulation example concerns the control system applied in RadMon neutron detector. The simulation results well correspond to the data calculated from mathematical model of SEU occurrence. The simulation considering SEUs can be used in design of radiation tolerate circuits.

Back to Program

Sessions Sunday Monday Tuesday Wednesday Thursday Authors

Nanotech 2006 Conference Program Abstract

 
Nanotechnology Conference | Terms of use | Privacy policy | Contact | NSTI Home
Program | Technical Conferences | Business & Development | Nano Impact Workshop | Nanotech Job Fair | Expo |
Nanotech 2006 Home | Press Room | Venue | Subscribe | Site Map
Names, and logos of other organizations are the property of those organizations and not of NSTI.
This event is not open to the general public and NSTI reserves the right to refuse admission and participation to any individual.