In-situ Study of SAMs Growth Process by Cross Analysis of AFM Height and Lateral Deflection
C-L Wu, F-G Tseng and C-C Chieng
National Tsing Hua University, TW
in-situ, AFM, growth, self assembly monolayer, lateral deflection
We set a model for analysis the AFM image, by cross analysis multiple channel, we can investigate more nano scale information on surafce property.
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Nanotech 2005 Conference Program Abstract