Nano Science and Technology InstituteNano Science and Technology Institute
Nano Science and Technology Institute 2005 NSTI Nanotechnology Conference & Trade Show
Nanotech 2005
Bio Nano 2005
Business & Investment
Nano Impact Workshop
Program
Sessions
Sunday
Monday
Tuesday
Wednesday
Thursday
Index of Authors
Index of Keywords
Keynote Presentations
Confirmed Speakers
Participating Companies
Industry Focus Sessions
Nanotech Expo
Special Symposia
Conferences
Sponsors
Exhibitors
Venue 2005
Organization
Press Room
Subscribe
Site Map
Nanotech 2005 At A Glance
Nanotech Proceedings
Nanotechnology Proceedings
Global Partner
nano tech
Supporting Organizations
Nanotech 2005 Supporting Organization
Media Sponsors
Nanotech 2005 Medias Sponsors
Event Contact
696 San Ramon Valley Blvd., Ste. 423
Danville, CA 94526
Ph: (925) 353-5004
Fx: (925) 886-8461
E-mail:
 
 

Spectroscopic and Structural Studies of Wide-Bandgap III-Nitride Nanorods and Nanowires

N.A. Sanford, J.B. Schlager, J.M. Barker, M.H. Gray, A. Roshko, J.E. Van Nostrand, C.E. Stutz, R. Cortez, M. He and A. Motayed
NIST, US

Keywords:
nanowires, nanorods, gallium nitride, III-nitrides, wide-bandgap semiconductors, NSOM, confocal microsocpy, multiphoton spectroscopy

Abstract:
Nanowires fabricated in wide-bandgap III-nitrides are receiving considerable attention because of their potential for realizing structures with very low defect densities that may enable new applications in UV optoelectronics. We have grown GaN nanorods on c-plane sapphire substrates by plasma-assisted molecular-beam epitaxy. Nanorod samples grown with and without InGaN quantum wells were produced and studied. In addition, GaN nanowires grown by the direct reaction of Ga with ammonia were also fabricated. In order to quantify these nanostructures and assess their down-stream utility for UV optoelectronic devices and other potential applications, high-resolution microscopy, spectroscopy, and structural analysis must be performed. We have studied these materials using high-spatial-resolution spectroscopy (including NSOM, cathodoluminescence, and nonlinear multiphoton confocal microsocopy), X-ray diffraction, AFM, TEM, and have prepared samples for transport measurements via the direct writing of metal contacts to nanowires using FIB. Details and results of these investigations will be presented at the meeting.

Back to Program

Sessions Sunday Monday Tuesday Wednesday Thursday Authors

Nanotech 2005 Conference Program Abstract

 
Gold Sponsors
Nanotech Gold Sponsors
Silver Sponsors
Nanotech Silver Sponsors
Gold Key Sponsors
Nanotech Gold Key Sponsors
Nanotech Ventures Sponsors
Nanotech Ventures Sponsors
Sponsors
Nanotech Sponsors
News Headlines
NSTI Online Community
 
 

© Nano Science and Technology Institute, all rights reserved.
Terms of use | Privacy policy | Contact