Nano Science and Technology InstituteNano Science and Technology Institute
Nano Science and Technology Institute 2005 NSTI Nanotechnology Conference & Trade Show
Nanotech 2005
Bio Nano 2005
Business & Investment
Nano Impact Workshop
Program
Sessions
Sunday
Monday
Tuesday
Wednesday
Thursday
Index of Authors
Index of Keywords
Keynote Presentations
Confirmed Speakers
Participating Companies
Industry Focus Sessions
Nanotech Expo
Special Symposia
Conferences
Sponsors
Exhibitors
Venue 2005
Organization
Press Room
Subscribe
Site Map
 
Nanotech 2005 At A Glance
Nanotech Proceedings
Nanotechnology Proceedings
Global Partner
nano tech
Supporting Organizations
Nanotech 2005 Supporting Organization
Media Sponsors
Nanotech 2005 Medias Sponsors
Event Contact
696 San Ramon Valley Blvd., Ste. 423
Danville, CA 94526
Ph: (925) 353-5004
Fx: (925) 886-8461
E-mail:
 
 

Video Rate Atomic Force Microscopy

A.D.L. Humphris, D.J. Catto and J.K. Hobbs
Infinitesima Ltd., UK

Keywords:
high speed, AFM, SPM, video rate

Abstract:
In this paper the limitations of conventional approaches to scanning probe microscopy will be considered and new methods that over come these problems will be introduced. A video rate atomic force microscope will be presented that utilises a novel feedback system and micro resonant scanner which is capable of imaging a 3µm x 3µm area in less than 40 milliseconds, this is approximately 1000 time faster than conventional methods. The ability of the video rate atomic force microscope to follow molecular process with nanometre resolution at the millisecond time scale will be demonstrated through the real time visualisation of the crystallisation of a molten polymer surface. The high frame rate of the microscope also reduces the effect of the external environment and enables the user to explore the surface of the sample with nanometre resolution in real time. The presentation will also consider some of the devise and wide ranging applications that have been limited by the slow image acquisition rates of conventional atomic force microscopy, such as large area inspection and nanolithography.

Back to Program

Sessions Sunday Monday Tuesday Wednesday Thursday Authors

Nanotech 2005 Conference Program Abstract

 
Gold Sponsors
Nanotech Gold Sponsors
Silver Sponsors
Nanotech Silver Sponsors
Gold Key Sponsors
Nanotech Gold Key Sponsors
Nanotech Ventures Sponsors
Nanotech Ventures Sponsors
Sponsors
Nanotech Sponsors
News Headlines
NSTI Online Community
 
 

© Nano Science and Technology Institute, all rights reserved.
Terms of use | Privacy policy | Contact